A silicon carbide array for electrocorticography and peripheral nerve recording

Current neural probes have a limited device lifetime of a few years. Their common failure mode is the degradation of insulating films and/or the delamination of the conductor-insulator interfaces. We sought to develop a technology that does not suffer from such limitations and would be suitable for...

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Bibliographic Details
Published in:Journal of neural engineering Vol. 14; no. 5; p. 056006
Main Authors: Diaz-Botia, C A, Luna, L E, Neely, R M, Chamanzar, M, Carraro, C, Carmena, J M, Sabes, P N, Maboudian, R, Maharbiz, M M
Format: Journal Article
Language:English
Published: England 01-10-2017
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