Micro crack analysis of optical fiber by specialized TD-OCT
•We have developed the specialized TD-OCT systems with the rotation mechanism for reference paths scanning.•It is now possible to conduct the absolute measurement within the error of ±3 dB and the return loss range of −10 to −100 dB.•This system can detect the existence of the hidden fiber micro cra...
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| Published in: | Optics and laser technology Vol. 116; pp. 22 - 25 |
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| Abstract | •We have developed the specialized TD-OCT systems with the rotation mechanism for reference paths scanning.•It is now possible to conduct the absolute measurement within the error of ±3 dB and the return loss range of −10 to −100 dB.•This system can detect the existence of the hidden fiber micro crack.•Return Loss on the surface of the optical fiber is the sum of the Fresnel reflection and the scattered light.•Measurement value is matched with the theoretical value until the degree of the surface angle θb < 8°.
We have developed a method to evaluate absolute value of return loss from crack on an optical fiber in an optical connector by using the specialized TD-OCT. The absolute measurement of the return loss could be accomplished in the range of −10 to −100 dB with an error of ±3 dB. As a result, the micro crack of the optical fiber could be evaluated quantitatively. Furthermore, the state of the micro crack, which could not be detected in the past, was able to be analyzed without taking the product apart. If the value of the return loss and the elapsed time from its manufacturing are known, the angle of micro crack of the optical fiber and presence or absence of the gap between the fracture endfaces can be estimated. |
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| AbstractList | We have developed a method to evaluate absolute value of return loss from crack on an optical fiber in an optical connector by using the specialized TD-OCT. The absolute measurement of the return loss could be accomplished in the range of −10 to −100 dB with an error of ±3 dB. As a result, the micro crack of the optical fiber could be evaluated quantitatively. Furthermore, the state of the micro crack, which could not be detected in the past, was able to be analyzed without taking the product apart. If the value of the return loss and the elapsed time from its manufacturing are known, the angle of micro crack of the optical fiber and presence or absence of the gap between the fracture endfaces can be estimated. •We have developed the specialized TD-OCT systems with the rotation mechanism for reference paths scanning.•It is now possible to conduct the absolute measurement within the error of ±3 dB and the return loss range of −10 to −100 dB.•This system can detect the existence of the hidden fiber micro crack.•Return Loss on the surface of the optical fiber is the sum of the Fresnel reflection and the scattered light.•Measurement value is matched with the theoretical value until the degree of the surface angle θb < 8°. We have developed a method to evaluate absolute value of return loss from crack on an optical fiber in an optical connector by using the specialized TD-OCT. The absolute measurement of the return loss could be accomplished in the range of −10 to −100 dB with an error of ±3 dB. As a result, the micro crack of the optical fiber could be evaluated quantitatively. Furthermore, the state of the micro crack, which could not be detected in the past, was able to be analyzed without taking the product apart. If the value of the return loss and the elapsed time from its manufacturing are known, the angle of micro crack of the optical fiber and presence or absence of the gap between the fracture endfaces can be estimated. |
| Author | Tanaka, Masayuki Shiina, Tatsuo |
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| Cites_doi | 10.1049/el:19930850 10.1541/ieejfms.138.198 10.1126/science.1957169 10.1109/50.285362 10.1109/2944.796345 10.1364/AO.30.002975 10.1111/j.1151-2916.1993.tb03937.x 10.1016/0030-3992(82)90007-X 10.1098/rsta.1921.0006 10.1364/AO.42.003795 10.1002/app.1979.070230323 10.1364/AO.16.001323 10.1002/app.1979.070230304 10.1049/el:19910325 |
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| Keywords | Reflection value Micro crack Time domain OCT Absolute value Optical fiber |
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| References | Tanaka, Shiina (b0115) 2018 Kersey, Marrone, Davis (b0075) 1991; 27 Back Reflection meter BR-Hb001, OPT Gate products catalog. Miki, Sudo (b0005) 2002 Brezinski, Fujimoto (b0070) 1999; 5 Tsuchiya, Nakagome (b0050) 1977; 16 Takada, Horiguchi (b0080) 1994; 12 Dr. G. Scott Glaesemann, Review of Research at Corning’s Optical Fiber Strength Laboratory White Paper, WP8002, 2017. Muraoka, Abe (b0015) 1993; 76 Yoshizawa (b0105) 2015 Shiina (b0110) 2014 M. Takahashi, Doctoral thesis of Shizuoka University, 1997. (written in Japanese). Danielson, Boisrobert (b0060) 1991; 30 Ivan Padron Eds, Interferometry, Chapter 1, Intech Open, 2012. M. Tanaka, T. Shiina, IEEJ Transaction on Fundamentals and Materials, vol. 138, 2018, pp. 198–203. (written in Japanese). Wolfgang Drexler, James G. Fujimoto (Eds.), Springer-Verlag Berlin Heidelberg, 2008. Miller, Mettler, White (b0040) 1986 Huang, Swanson, Lin, Schuman, Stinson, Chang, Hee, Flotte, Gregory, Puliafito, Fujimoto (b0065) 1911; 254 Schonhorn (b0025) 1979; 23 Cooper, Leach, Harding, Matthews (b0035) 1982; 14 Shiina, Oritani, Ito, Okamura (b0095) 2003; 42 Takada, Horiguchi (b0085) 1993; 29 Shiina, Miyazaki, Honda (b0100) 2009; 129 Wang, Vazirani, Schonhorn, Zupko (b0030) 1979; 23 Griffith (b0010) 1921; 221 Brezinski (10.1016/j.optlastec.2019.02.057_b0070) 1999; 5 10.1016/j.optlastec.2019.02.057_b0045 10.1016/j.optlastec.2019.02.057_b0020 Takada (10.1016/j.optlastec.2019.02.057_b0085) 1993; 29 10.1016/j.optlastec.2019.02.057_b0120 10.1016/j.optlastec.2019.02.057_b0125 Takada (10.1016/j.optlastec.2019.02.057_b0080) 1994; 12 Shiina (10.1016/j.optlastec.2019.02.057_b0100) 2009; 129 Yoshizawa (10.1016/j.optlastec.2019.02.057_b0105) 2015 Kersey (10.1016/j.optlastec.2019.02.057_b0075) 1991; 27 10.1016/j.optlastec.2019.02.057_b0055 Shiina (10.1016/j.optlastec.2019.02.057_b0095) 2003; 42 Muraoka (10.1016/j.optlastec.2019.02.057_b0015) 1993; 76 Tsuchiya (10.1016/j.optlastec.2019.02.057_b0050) 1977; 16 10.1016/j.optlastec.2019.02.057_b0090 Huang (10.1016/j.optlastec.2019.02.057_b0065) 1911; 254 Griffith (10.1016/j.optlastec.2019.02.057_b0010) 1921; 221 Miki (10.1016/j.optlastec.2019.02.057_b0005) 2002 Schonhorn (10.1016/j.optlastec.2019.02.057_b0025) 1979; 23 Shiina (10.1016/j.optlastec.2019.02.057_b0110) 2014 Cooper (10.1016/j.optlastec.2019.02.057_b0035) 1982; 14 Tanaka (10.1016/j.optlastec.2019.02.057_b0115) 2018 Miller (10.1016/j.optlastec.2019.02.057_b0040) 1986 Wang (10.1016/j.optlastec.2019.02.057_b0030) 1979; 23 Danielson (10.1016/j.optlastec.2019.02.057_b0060) 1991; 30 |
| References_xml | – volume: 12 start-page: 658 year: 1994 end-page: 663 ident: b0080 publication-title: Member, IEEE, J Lightwave Technol. contributor: fullname: Horiguchi – volume: 14 start-page: 87 year: 1982 end-page: 91 ident: b0035 publication-title: Opt. Laser Technol. contributor: fullname: Matthews – start-page: 83 year: 2014 end-page: 90 ident: b0110 publication-title: Proceeding of PHOTOPTICS 2014 contributor: fullname: Shiina – volume: 76 start-page: 1545 year: 1993 end-page: 1550 ident: b0015 publication-title: J. Am. Ceram. Soc. contributor: fullname: Abe – volume: 16 start-page: 1323 year: 1977 end-page: 1331 ident: b0050 publication-title: Appl. Opt. contributor: fullname: Nakagome – volume: 23 start-page: 687 year: 1979 end-page: 694 ident: b0025 publication-title: J. Appl. Polym. Sci. contributor: fullname: Schonhorn – volume: 29 start-page: 1273 year: 1993 end-page: 1275 ident: b0085 publication-title: Electron. Lett. contributor: fullname: Horiguchi – volume: 254 start-page: 1178 year: 1911 end-page: 1181 ident: b0065 publication-title: Science contributor: fullname: Fujimoto – volume: 27 start-page: 518 year: 1991 end-page: 520 ident: b0075 publication-title: Electron. Lett. contributor: fullname: Davis – volume: 30 start-page: 2975 year: 1991 end-page: 2979 ident: b0060 publication-title: Appl. Opt. contributor: fullname: Boisrobert – volume: 221 start-page: 163 year: 1921 end-page: 198 ident: b0010 publication-title: Philos. Trans. R. Soc.(London), Sect. A contributor: fullname: Griffith – volume: 42 start-page: 2795 year: 2003 end-page: 3799 ident: b0095 publication-title: Appl. Opt. contributor: fullname: Okamura – volume: 129 start-page: 1276 year: 2009 end-page: 1281 ident: b0100 publication-title: Trans. IEEJ C contributor: fullname: Honda – volume: 23 start-page: 887 year: 1979 end-page: 892 ident: b0030 publication-title: J. Appl. Polym. Sci. contributor: fullname: Zupko – year: 2015 ident: b0105 article-title: Handbook of Optical Metrology: Principles and Applications contributor: fullname: Yoshizawa – year: 1986 ident: b0040 article-title: Optical Fiber Splices and Connectors: Theory and Methods (Optical Engineering Series) contributor: fullname: White – year: 2018 ident: b0115 article-title: Proceeding of CLRC 2018 contributor: fullname: Shiina – year: 2002 ident: b0005 article-title: Hikari tuushin gijyutu handbook contributor: fullname: Sudo – volume: 5 start-page: 1185 year: 1999 end-page: 1192 ident: b0070 publication-title: IEEE J. Sel. Top. Quantum Electron. contributor: fullname: Fujimoto – volume: 29 start-page: 1273 year: 1993 ident: 10.1016/j.optlastec.2019.02.057_b0085 publication-title: Electron. Lett. doi: 10.1049/el:19930850 contributor: fullname: Takada – year: 1986 ident: 10.1016/j.optlastec.2019.02.057_b0040 contributor: fullname: Miller – ident: 10.1016/j.optlastec.2019.02.057_b0090 doi: 10.1541/ieejfms.138.198 – ident: 10.1016/j.optlastec.2019.02.057_b0045 – ident: 10.1016/j.optlastec.2019.02.057_b0020 – ident: 10.1016/j.optlastec.2019.02.057_b0125 – volume: 254 start-page: 1178 year: 1911 ident: 10.1016/j.optlastec.2019.02.057_b0065 publication-title: Science doi: 10.1126/science.1957169 contributor: fullname: Huang – start-page: 83 year: 2014 ident: 10.1016/j.optlastec.2019.02.057_b0110 contributor: fullname: Shiina – year: 2018 ident: 10.1016/j.optlastec.2019.02.057_b0115 contributor: fullname: Tanaka – volume: 12 start-page: 658 year: 1994 ident: 10.1016/j.optlastec.2019.02.057_b0080 publication-title: Member, IEEE, J Lightwave Technol. doi: 10.1109/50.285362 contributor: fullname: Takada – volume: 5 start-page: 1185 year: 1999 ident: 10.1016/j.optlastec.2019.02.057_b0070 publication-title: IEEE J. Sel. Top. Quantum Electron. doi: 10.1109/2944.796345 contributor: fullname: Brezinski – volume: 30 start-page: 2975 issue: 21 year: 1991 ident: 10.1016/j.optlastec.2019.02.057_b0060 publication-title: Appl. Opt. doi: 10.1364/AO.30.002975 contributor: fullname: Danielson – volume: 76 start-page: 1545 issue: 6 year: 1993 ident: 10.1016/j.optlastec.2019.02.057_b0015 publication-title: J. Am. Ceram. Soc. doi: 10.1111/j.1151-2916.1993.tb03937.x contributor: fullname: Muraoka – volume: 14 start-page: 87 year: 1982 ident: 10.1016/j.optlastec.2019.02.057_b0035 publication-title: Opt. Laser Technol. doi: 10.1016/0030-3992(82)90007-X contributor: fullname: Cooper – ident: 10.1016/j.optlastec.2019.02.057_b0055 – year: 2002 ident: 10.1016/j.optlastec.2019.02.057_b0005 contributor: fullname: Miki – volume: 221 start-page: 163 year: 1921 ident: 10.1016/j.optlastec.2019.02.057_b0010 publication-title: Philos. Trans. R. Soc.(London), Sect. A doi: 10.1098/rsta.1921.0006 contributor: fullname: Griffith – volume: 42 start-page: 2795 year: 2003 ident: 10.1016/j.optlastec.2019.02.057_b0095 publication-title: Appl. Opt. doi: 10.1364/AO.42.003795 contributor: fullname: Shiina – volume: 23 start-page: 887 year: 1979 ident: 10.1016/j.optlastec.2019.02.057_b0030 publication-title: J. Appl. Polym. Sci. doi: 10.1002/app.1979.070230323 contributor: fullname: Wang – volume: 16 start-page: 1323 year: 1977 ident: 10.1016/j.optlastec.2019.02.057_b0050 publication-title: Appl. Opt. doi: 10.1364/AO.16.001323 contributor: fullname: Tsuchiya – year: 2015 ident: 10.1016/j.optlastec.2019.02.057_b0105 contributor: fullname: Yoshizawa – volume: 23 start-page: 687 year: 1979 ident: 10.1016/j.optlastec.2019.02.057_b0025 publication-title: J. Appl. Polym. Sci. doi: 10.1002/app.1979.070230304 contributor: fullname: Schonhorn – volume: 129 start-page: 1276 year: 2009 ident: 10.1016/j.optlastec.2019.02.057_b0100 publication-title: Trans. IEEJ C contributor: fullname: Shiina – volume: 27 start-page: 518 year: 1991 ident: 10.1016/j.optlastec.2019.02.057_b0075 publication-title: Electron. Lett. doi: 10.1049/el:19910325 contributor: fullname: Kersey – ident: 10.1016/j.optlastec.2019.02.057_b0120 |
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| Snippet | •We have developed the specialized TD-OCT systems with the rotation mechanism for reference paths scanning.•It is now possible to conduct the absolute... We have developed a method to evaluate absolute value of return loss from crack on an optical fiber in an optical connector by using the specialized TD-OCT.... |
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| SubjectTerms | Absolute value Cables Micro crack Optical connectors Optical fiber Optical fibers Reflection value Time domain OCT |
| Title | Micro crack analysis of optical fiber by specialized TD-OCT |
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