Epitaxial growth and characterization of Fe thin films on wurtzite GaN(0 0 0 1)

Fe films of different thicknesses were deposited on wurtzite GaN(0 0 0 1) layers by electron beam evaporation. They were studied by a number of characterization techniques such as low-energy electron diffraction (LEED), X-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscatterin...

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Bibliographic Details
Published in:	Journal of crystal growth Vol. 283; no. 3; pp. 500 - 507
Main Authors:	Meijers, R., Calarco, R., Kaluza, N., Hardtdegen, H., Ahe, M.v.d., Bay, H.L., Lüth, H., Buchmeier, M., Bürgler, D.E.
Format:	Journal Article
Language:	English
Published:	Amsterdam Elsevier B.V 01-10-2005 Elsevier
Subjects:	A1. Crystal structure B1. Metals B1. Nitrides B2. Magnetic materials Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science; rheology Exact sciences and technology Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance Magnetic properties and materials Magnetic resonances and relaxations in condensed matter, mössbauer effect Materials science Methods of crystal growth; physics of crystal growth Physics Studies of specific magnetic materials B1. Nitrides A1. Crystal structure B2. Magnetic materials 75.50.Bb 81.15.Ef B1. Metals 75.70 .- i 81.05.Ea Atomic force microscopy Spectroscopy RBS Inorganic compounds Films Gallium nitrides Epitaxy Iron XRD Thin films Thickness Ferromagnetic resonance Transition elements 75.50.Bb; 75.70 LEED i; 81.05.Ea; 81.15.Ef Al. Crystal structure; Bl. Metals; Bl. Nitrides; B2. Magnetic materials Electron beam evaporation
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Summary:	Fe films of different thicknesses were deposited on wurtzite GaN(0 0 0 1) layers by electron beam evaporation. They were studied by a number of characterization techniques such as low-energy electron diffraction (LEED), X-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS), and ferromagnetic resonance (FMR). Despite the large lattice mismatch between Fe and wurtzite GaN a clear epitaxial relation was determined. Three distinct Fe domain orientations were found rotated by 120 ∘ relative to each other. Due to the formation of crystalline domains a hexagonal in-plane magnetic anisotropy was observed.
ISSN:	0022-0248 1873-5002
DOI:	10.1016/j.jcrysgro.2005.06.004