Investigating ice surfaces formed near the freezing point in the vapor phase via atomic force microscopy

• Published in: Japanese Journal of Applied Physics Vol. 58; no. SI; p. SIIA09
• Main Authors: Miyato, Yuji, Otani, Katsuki, Maeda, Motoyasu, Nagashima, Ken, Abe, Masayuki
• Format: Journal Article
• Language: English
• Published: Tokyo IOP Publishing 01-08-2019; Japanese Journal of Applied Physics
• Subjects: Atomic force microscopes; Atomic force microscopy; Environmental control; Equilibrium conditions; Freezing; Frequency modulation; Ice formation; Melting points; Microscopes; Morphology; Substrates; Vapor phases; Water vapor
• ISSN: 0021-4922; 1347-4065
• DOI: 10.7567/1347-4065/ab203d

An atomic force microscope (AFM) using a qPlus sensor was developed to observe ice surfaces grown near the freezing point in the vapor phase. The AFM system was equipped with multi-environmental control mechanisms for the temperature, humidity, and pressure of the introduced gas and the substrate temperature. Topographic images of the basal face of the ice, grown from a supersaturated water vapor, were obtained near equilibrium conditions via frequency modulation AFM (FM-AFM). Surface morphologies corresponding to steps and terraces were successfully observed. Force-curve measurements were also performed on the ice surfaces using FM-AFM. The results can be explained by the quasi-liquid layer on the ice surface.