Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM

• Published in: Applied surface science Vol. 157; no. 4; pp. 218 - 221
• Main Authors: Hosoi, H, Sueoka, K, Hayakawa, K, Mukasa, K
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01-04-2000; Elsevier Science
• Subjects: APN; Atomic force microscope; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Nickel oxide; Non-contact; Physics; Solid surfaces and solid-solid interfaces; Surface structure and topography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); 61.16Ch; 07.79Lh; Atomic force microscope; NE; Non-contact; Nickel oxide; APN; Nickel oxides; Atomic force microscopy; Inorganic compounds; Transition element compounds; Sublattices; Cleavage; Experimental study; Non contact measurement; Surface structure
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/S0169-4332(99)00529-2

We have observed the cleaved NiO(100) surface by means of the UHV non-contact atomic force microscopy (NC-AFM). Atomically resolved NC-AFM images of NiO(100)-cleaved surface has successfully obtained with atomically distinguishable defects at room temperature. The distance of the observed periodic protrusions is about 4.2 Å and the periodicity corresponds to that of sublattice of NiO single crystal.