Soft X-ray resonant magnetic scattering from FePd thin films: a study of the micromagnetic components

• Published in: Physica. B, Condensed matter Vol. 345; no. 1; pp. 143 - 147
• Main Authors: Beutier, Guillaume, Marty, Alain, Chesnel, Karine, Belakhovsky, Michel, Toussaint, Jean-Christophe, Gilles, Bruno, Laan, Gerrit van der, Collins, Steve, Dudzik, Esther
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01-03-2004; Elsevier
• Subjects: Applied sciences; Condensed Matter; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; FePd; Magnetic anisotropy; Magnetic properties and materials; Magnetic properties of monolayers and thin films; Magnetic properties of surface, thin films and multilayers; Magnetic scattering; Materials Science; Metals. Metallurgy; Micromagnetic simulation; Physics; Soft X-ray; Soft X-ray; FePd; Magnetic scattering; Magnetic anisotropy; 75.70.−i; 75.50.Bb; 78.70.Ck; 75.30.Gw; Micromagnetic simulation; Soft X radiation; Magnetization; Iron alloys; 75.70.-i Soft X-ray; Experimental study; Thin films; Binary alloys; X-ray scattering; Micromagnetism; Palladium alloys; Perpendicular magnetic anisotropy; Transition element alloys
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/j.physb.2003.11.041

Soft X-ray resonant magnetic scattering (SXRMS) was performed on a FePd alloy thin film at the L
3-edge of Fe. This film exhibits perpendicular magnetic anisotropy giving rise to periodic alternation of up and down magnetisation domains with closure domains. Rocking curves performed in transverse geometry allowed us to measure the magnetic periodicity and correlation length of domains. Micromagnetic simulations of the FePd layers and SXRMS calculations were made to analyse the asymmetry ratio of magnetic satellite intensities, hence allowing us to quantify the magnetic anisotropy.