Verification of magnetized electron series resonance from 1-D plasma diode noise current

• Published in: IEEE transactions on plasma science Vol. 30; no. 5; pp. 2035 - 2041
• Main Authors: Qiu, W., Birdsall, C.K.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-10-2002; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Circuit noise; Decay; Diodes; Electrons; Equivalent circuits; Exact sciences and technology; Magnetic resonance; Magnetism; Magnetohydrodynamic generators and thermionic convertors; plasma diodes; Mathematical models; Noise; Physics; Physics of gases, plasmas and electric discharges; Physics of plasmas and electric discharges; Plasma; Plasma density; Plasma devices; Plasma diodes; Plasma sheaths; Plasma simulation; Predictive models; Resonant frequencies; Resonant frequency; Simulation; Spectra; Plasma diodes; Plasma; Magnetoplasma; Cold plasma; Theoretical study; Plasma devices; Plasma sheaths; Equivalent circuits
• ISSN: 0093-3813; 1939-9375
• DOI: 10.1109/TPS.2002.805324

A plasma diode appears resistive to an external observer at the magnetized electron series resonance (MESR). The authors derive the MESR resonant frequencies from an equivalent circuit model using linear cold plasma theory. The noise current from a decaying plasma is predicted to exhibit the MESR resonant frequencies and is verified by observing the spectra of the noise currents in 1d3v simulations. The spectra compare well with the theoretical values, which depend on the (central) plasma density and the sheath thickness. The latter is obtained from the (warm) plasma simulations.