Algorithms for determining the phase of RHEED oscillations

• Published in: Journal of applied crystallography Vol. 48; no. 6; pp. 1927 - 1934
• Main Authors: Mitura, Zbigniew, Dudarev, Sergei L.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01-12-2015; Blackwell Publishing Ltd
• Subjects: Algorithms; Computation; Computer simulation; Crystallography; Diffraction; Diffraction theory; direct modelling; Fourier analysis; Fourier deconvolution; Mathematical analysis; Microscopes; Oscillations; Reflection; reflection high-energy electron diffraction (RHEED); RHEED oscillations
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S1600576715020415

Oscillations of reflection high‐energy electron diffraction (RHEED) intensities are computed using dynamical diffraction theory. The phase of the oscillations is determined using two different approaches. In the first, direct, approach, the phase is determined by identifying the time needed to reach the second oscillation minimum. In the second approach, the phase is found using harmonic analysis. The two approaches are tested by applying them to oscillations simulated using dynamical diffraction theory. The phase of RHEED oscillations observed experimentally is also analysed. Experimental data on the variation of the phase as a function of the glancing angle of incidence, derived using the direct method, are compared with the values computed using both the direct and harmonic methods. For incident‐beam azimuths corresponding to low‐symmetry directions, both approaches produce similar results.