Noise behavior of Schottky barrier gate field-effect transistors at microwave frequencies

The noise behavior of a Schottky barrier gate field-effect transistor is investigated by the use of the noise equivalent circuit. The influence of the carrier velocity saturation is estimated. The noise parameters are calculated by taking into account the influence of parasitic resistances. Measured...

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Bibliographic Details
Published in:IEEE transactions on electron devices Vol. 18; no. 2; pp. 97 - 104
Main Author: Baechtold, W.
Format: Journal Article
Language:English
Published: IEEE 01-02-1971
Online Access:Get full text
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Summary:The noise behavior of a Schottky barrier gate field-effect transistor is investigated by the use of the noise equivalent circuit. The influence of the carrier velocity saturation is estimated. The noise parameters are calculated by taking into account the influence of parasitic resistances. Measured and calculated noise parameters show good agreement in the frequency range 2-8 GHz.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1971.17156