SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx Artix-7 FPGA under different angles of incidence. Experimental results indicating SEUs on configuration RAM (CRAM) cells,...

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Bibliographic Details

Published in:	Microprocessors and microsystems Vol. 96; p. 104743
Main Authors:	Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Hubert, Guillaume, Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01-02-2023 Elsevier
Subjects:	Angle of incidence Engineering Sciences FPGA Physics Radiation hardness Soft error Thermal neutrons Thermal neutrons Soft error FPGA Radiation hardness Angle of incidence
Online Access:	Get full text
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