Correction of stray light and filter scratch blurring for ASTER imagery

• Published in: IEEE transactions on geoscience and remote sensing Vol. 43; no. 12; pp. 2763 - 2768
• Main Authors: Iwasaki, A., Oyama, E.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-12-2005; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Advanced Spaceborne Thermal Emission Reflection Radiometer (ASTER); Deconvolution; Equivalence; filter scratch; Filters; Image quality; Image sensors; Infrared; Infrared imaging; Interference; Mathematical analysis; Moon; Optical reflection; Radiometers; Reflection; shortwave infrared (SWIR); Stray light; Thermal emission; visible near-infrared (VNIR)
• ISSN: 0196-2892; 1558-0644
• DOI: 10.1109/TGRS.2005.855065

Stray light components in images obtained by the shortwave infrared (SWIR) and visible near-infrared (VNIR) radiometers of the Advanced Spaceborne Thermal Emission Reflection Radiometer (ASTER) were investigated. A simple method, which is equivalent to the van Cittert method of deconvolution, was used for correction. The stray light components were estimated using the image obtained during lunar observation, and the improvement in image quality was examined after stray light correction. The calculation is performed in the space domain, and application to the filter scratch problem of the ASTER/SWIR sensor, which has a scratch on the interference filter resulting in partially degenerated images, is also demonstrated.