In situ observation of the orientation relationship at the interface plane between substrate and nucleus using X-ray scattering techniques

• Published in: Scripta materialia Vol. 77; pp. 60 - 63
• Main Authors: Brown, A.J., Dong, H.B., Howes, P.B., Nicklin, C.L.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 15-04-2014
• Subjects: Aluminium; Heterogeneous nucleation; Nucleation undercooling; Orientation relationship; X-ray diffraction; Nucleation undercooling; Heterogeneous nucleation; X-ray diffraction; Orientation relationship; Aluminium
• ISSN: 1359-6462; 1872-8456
• DOI: 10.1016/j.scriptamat.2014.01.023

Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with a specific crystal plane of a solid substrate. The diffraction data reveal the orientation relationship between the substrate and the nucleus, in particular the interface plane, and its influence on the required undercooling for nucleation.