Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics

• Published in: Materials Vol. 14; no. 11; p. 3056
• Main Authors: Kokosza, Łukasz, Pawlak, Jakub, Mitura, Zbigniew, Przybylski, Marek
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 03-06-2021; MDPI
• Subjects: Computer graphics; Computers; Crystal surfaces; Diffraction patterns; Flat surfaces; High vacuum; Lasers; Molecular beam epitaxy; Software; Thin films; X-rays
• ISSN: 1996-1944; 1996-1944
• DOI: 10.3390/ma14113056

The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction for a set of rods perpendicular to the crystal surface. This article describes how the utilization of computer graphics may be useful for realistic reproduction of experimental conditions, and then for carrying out the Ewald construction in a reciprocal 3D space. The computer software was prepared in the Java programing language. The software can be used to interpret real diffractions patterns for relatively flat surfaces, and thus it may be helpful in broad research practice.