3D Field Simulation of Complex Systems With Permanent Magnets and Excitation Coils

• Published in: IEEE transactions on applied superconductivity Vol. 18; no. 2; pp. 1609 - 1612
• Main Authors: Belov, A.V., Belyakova, T.F., Gornikel, I.V., Kuchinsky, V.G., Kukhtin, V.P., Lamzin, E.A., Semchenkov, A.G., Shatil, N.A., Sytchevsky, S.E.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01-06-2008; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accelerators; Applied sciences; Boundary conditions; Coils; Complex systems; Computer simulation; cyclotrons; Electrical engineering. Electrical power engineering; Electromagnets; Electronic tubes, masers; Electronics; Equations; Exact sciences and technology; Finite element methods; Magnetic domains; Magnetic materials; Magnetic properties; Magnetostatics; Materials; Mathematical models; motors; Numerical simulation; Permanent magnets; precision magnetic systems; Scalars; Superconducting magnets; Superconductivity; Three dimensional; tokamaks; Various equipment and components; Tokamak; precision magnetic systems; System configuration; Magnetostatics; Scalar potential; Complex system; motors; cyclotrons; tokamaks; Cyclotron; Accelerators; Magnetic potential; Magnet coils; Non linear properties; Properties of materials; Numerical simulation; System simulation; Electric motor; Permanent magnet; Electric current; Computer codes; Comparative study
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2008.920816

A unified method is proposed for numerical simulation of magnet systems of complex configurations, which contain permanent magnets and electric currents. The method is based on the use of a reduced scalar magnetic potential (the "T-Omega" method). Numerical simulations with the computer code KOMPOT allow magnetostatic analysis of precision magnet systems taking into account non-linear properties of magnetic materials. A comparison of calculated and measured data is presented for a test sample.