Kinetic surface roughening in molecular beam epitaxy of InP

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Bibliographic Details
Published in:	Physical review letters Vol. 70; no. 26; pp. 4106 - 4109
Main Authors:	COTTA, M. A, HAMM, R. A, STALEY, T. W, CHU, S. N. G, HARRIOTT, L. R, PANISH, M. B, TEMKIN, H
Format:	Journal Article
Language:	English
Published:	Ridge, NY American Physical Society 28-06-1993
Subjects:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Electron, ion, and scanning probe microscopy Exact sciences and technology Materials science Methods of deposition of films and coatings; film growth and epitaxy Molecular, atomic, ion, and chemical beam epitaxy Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Solid surfaces and solid-solid interfaces Structure of solids and liquids; crystallography Surface structure and topography Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Crystal growth Inorganic compounds Semiconductor materials Roughening transition Indium phosphides Molecular beam epitaxy Surfaces Kinetics Experimental study STM
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Description
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0031-9007 1079-7114
DOI:	10.1103/PhysRevLett.70.4106