Tangential-Normal Surface Testing for the Nonconforming Discretization of the Electric-Field Integral Equation

• Published in: IEEE antennas and wireless propagation letters Vol. 15; pp. 1581 - 1584
• Main Authors: Ubeda, E., Sekulic, I., Rius, Juan M., Heldring, A.
• Format: Journal Article Publication
• Language: English
• Published: New York IEEE 01-01-2016; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Basis functions; Camps elèctrics; Conductors; Electric breakdown; electric field integral equation (EFIE); Electric fields; Electromagnetisme; Equacions diferencials i integrals; Equacions integrals; Física; Impedance; Integral equations; Matemàtiques i estadística; Method of moments; Moment method; Surface impedance; Testing; Àrees temàtiques de la UPC
• ISSN: 1536-1225; 1548-5757
• DOI: 10.1109/LAWP.2016.2517411

Nonconforming implementations of the electric-field integral equation (EFIE), based on the facet-oriented monopolar-RWG set, impose no continuity constraints in the expansion of the current between adjacent facets. These schemes become more versatile than the traditional edge-oriented schemes, based on the RWG set, because they simplify the management of junctions in composite objects and allow the analysis of nonconformal triangulations. Moreover, for closed moderately small conductors with edges and corners, they show improved accuracy with respect to the conventional RWG-discretization. However, they lead to elaborate numerical schemes because the fields are tested inside the body, near the boundary surface, over volumetric subdomains attached to the surface meshing. In this letter, we present a new nonconforming discretization of the EFIE that results from testing with RWG functions over pairs of triangles such that one triangle matches one facet of the surface triangulation and the other one is oriented perpendicularly, inside the body. This "tangential-normal" testing scheme, based on surface integrals, simplifies considerably the matrix generation when compared to the volumetrically tested approaches.