Investigating the effects of reduced size on the properties of ferroelectrics

• Published in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 53; no. 12; pp. 2208 - 2225
• Main Authors: Saad, M.M., Baxter, P., McAneney, J., Lookman, A., Sinnamon, L.J., Evans, P., Schilling, A., Adams, T., Xinhua Zhu, Pollard, R.J., Bowman, R.M., Gregg, J.M., Dong Jin Jung, Morrison, F.D., Scott, J.F.
• Format: Journal Article
• Language: English
• Published: United States IEEE 01-12-2006; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Capacitors; Collapse; Computer Simulation; Crystalline materials; Dielectric constant; Dielectric materials; Dielectric thin films; Electric Impedance; Electrochemistry - instrumentation; Electrochemistry - methods; Electromagnetic Fields; Ferroelectric materials; Geometry; Materials Testing; Models, Chemical; Nanocomposites; Nanoporous materials; Nanostructure; Nanostructures - chemistry; Nanostructures - radiation effects; Nanostructures - ultrastructure; Particle Size; Permittivity; Physics; Polarization; Single crystals; Thin films
• ISSN: 0885-3010; 1525-8955
• DOI: 10.1109/TUFFC.2006.168

A series of experiments has been undertaken to understand more about the fundamental origin of the thickness-induced permittivity collapse often observed in conventional thin film ferroelectric heterostructures. The various experiments are discussed, highlighting the eventual need to examine permittivity collapse in thin film single crystal material. It has been seen that dielectric collapse is not a direct consequence of reduced size, and neither is it a consequence of unavoidable physics associated with the ferroelectric-electrode boundary. Research on three-dimensional shape-constrained ferroelectrics, emphasizing self-assembled structures based on nanoporous alumina templates and on FIB-milled single crystals, is also presented, and appears to represent an exciting area for ongoing research