Atomic layer deposition of YMnO3 thin films

• Published in: Journal of magnetism and magnetic materials Vol. 498; p. 166146
• Main Authors: Choi, Ju H., Pham, Calvin, Dorman, James, Kim, Taeseung, Chang, Jane P.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 15-03-2020; Elsevier BV
• Subjects: Anomalies; Atomic layer epitaxy; Composition effects; Deoxidizing; Film thickness; Lattice parameters; Magnetic permeability; Magnetic properties; Magnetism; Multiferroic materials; Radical-enhanced atomic layer deposition; Thin films; Unity; Yttria-stabilized zirconia; Yttrium manganate; Yttrium oxide; Zirconium dioxide; Radical-enhanced atomic layer deposition; Yttrium manganate; Multiferroic materials; Magnetic properties
• ISSN: 0304-8853; 1873-4766
• DOI: 10.1016/j.jmmm.2019.166146

•YMO thin films synthesized by radical-enhanced atomic layer deposition process.•The structural and morphological studies of films were carried out by XRD and TEM.•YMO films (∼6 nm) on YSZ (1 1 1) has both orthorhombic- and hexagonal- phases.•YMO films (∼6 nm) on YSZ (1 1 1) yielded two TN anomalies at ∼48 K and ∼85 K.•The magneto-electric behavior of YMO film on Si (1 1 1) was studied.
YMnO3 (YMO) thin films were synthesized by radical-enhanced atomic layer deposition (RE-ALD) on silicon (Si) and yttria-stabilized zirconia (YSZ)substrates, to investigate the effect of film composition and substrates on their intrinsic magnetic properties. The crystalline phase of these ultra-thin films depends on both the processing conditions and the substrate lattice parameters. The Mn/Y atomic ratio of the YMO thin films could be controlled near unity by adjusting the Mn:Y precursor pulsing ratio during the RE-ALD processes. The ALD YMO thin film on Si (111) was orthorhombic, regardless of the film thickness with a Néel temperature (TN) between 48 ∼ 62 K, as determined through the anomalies observed during DC magnetic susceptibility measurements. However, ultra-thin ALD YMO films (∼6 nm) on YSZ (1 1 1), at a Mn/Y atomic ratio near unity, has both orthorhombic- and hexagonal- phases, yielding two TN anomalies measured at ∼48 K and ∼85 K. The induction of magnetization of ultra-thin YMO film on Si (1 1 1) under an in-situ 20 V electric poling indicates that the magnetoelectric coupling was observed below TN, showing that the ALD synthesis could be a promising technique to deposit ultra-thin magnetoelectric films.