Enhanced Visualization and Interpretation of XMCD‐PEEM Data Using SOM‐RPM Machine Learning

Photoemission electron microscopy (PEEM) is a powerful technique for surface characterization that provides detailed information on the chemical and structural properties of materials at the nanoscale. In this study, the potential is explored using a machine learning algorithm called self‐organizing...

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Bibliographic Details
Published in:	Advanced materials interfaces Vol. 10; no. 36
Main Authors:	Wong, See Yoong, Harmer, Sarah L., Gardner, Wil, Schenk, Alex K., Ballabio, Davide, Pigram, Paul J.
Format:	Journal Article
Language:	English
Published:	Weinheim John Wiley & Sons, Inc 01-12-2023 Wiley-VCH
Subjects:	Algorithms Complexity Data acquisition Data smoothing Dichroism Electrons hyperspectral imaging Machine learning Material properties Photoelectric emission Photoelectrons Pyrrhotite relation perspective imaging SOM‐RPM Surface properties Synchrotrons Topographic maps Valence band Visualization XMCD‐PEEM
Online Access:	Get full text
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