Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
The composition distribution of In0.16Al0.34As0.41Sb0.09 layers grown at different temperatures with applications in solar cells have been analysed by atom probe tomography. Our results clearly show non-random distributions in both In and Sb in layers grown at 325 °C and 475 °C. The composition fluc...
Saved in:
Published in: | Journal of alloys and compounds Vol. 763; pp. 1005 - 1011 |
---|---|
Main Authors: | , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Lausanne
Elsevier B.V
30-09-2018
Elsevier BV Elsevier |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | The composition distribution of In0.16Al0.34As0.41Sb0.09 layers grown at different temperatures with applications in solar cells have been analysed by atom probe tomography. Our results clearly show non-random distributions in both In and Sb in layers grown at 325 °C and 475 °C. The composition fluctuations consist on smooth variations, with a statistically significant periodicity of 10 nm for In and for Sb in the material grown at 475 °C. The amplitude of the composition variations is larger for the layer grown at higher temperature, reaching values as high as 27% In. 3D In-rich regions as small as 1–3 nm have been visualized in both structures, which is a remarkable finding. Our results clearly show a strong influence of the growth temperature in the composition distribution of the InAlAsSb alloy, what explains its previously observed optoelectronic properties.
[Display omitted]
•The epitaxial growth of the novel semiconductor InAlAsSb leads to inhomogeneity.•In-rich regions with nucleus as small as of 1–3 nm are found by atom probe tomography.•The magnitude of the compositions fluctuations in enhanced with growth temperature.•Detailed 3D compositional information explains previous photoluminescence properties. |
---|---|
ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2018.05.333 |