A new microwave resonant technique for studying rare earth photoionization thresholds in dielectric crystals under laser irradiation
A new technique is presented for measuring the location of the rare earth energy levels with respect to the host conduction band in rare earth doped insulators. This technique is based on the detection of microwave absorption by the rare earth doped crystal inserted in a resonant microwave cavity an...
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| Published in: | Optical materials Vol. 24; no. 1; pp. 137 - 141 |
|---|---|
| Main Authors: | , , , , , |
| Format: | Journal Article Conference Proceeding |
| Language: | English |
| Published: |
Amsterdam
Elsevier B.V
01-10-2003
Elsevier Science Elsevier |
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| Abstract | A new technique is presented for measuring the location of the rare earth energy levels with respect to the host conduction band in rare earth doped insulators. This technique is based on the detection of microwave absorption by the rare earth doped crystal inserted in a resonant microwave cavity and irradiated by photons of sufficient energy to induce the rare earth photoionization. The results obtained with CaF
2:Sm
2+ and Lu
2(SiO
4)O:Ce
3+ indicate photoionization thresholds at 380 nm (3.3 eV) and 400 nm (3.1 eV), respectively. |
|---|---|
| AbstractList | A new technique is presented for measuring the location of the rare earth energy levels with respect to the host conduction band in rare earth doped insulators. This technique is based on the detection of microwave absorption by the rare earth doped crystal inserted in a resonant microwave cavity and irradiated by photons of sufficient energy to induce the rare earth photoionization. The results obtained with CaF
2:Sm
2+ and Lu
2(SiO
4)O:Ce
3+ indicate photoionization thresholds at 380 nm (3.3 eV) and 400 nm (3.1 eV), respectively. |
| Author | Kazanskii, S.A. Pédrini, C. Gâcon, J.-C. Guyot, Y. Rivoire, J.-Y. Joubert, M.-F. |
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| CitedBy_id | crossref_primary_10_1016_j_jlumin_2007_02_020 crossref_primary_10_1016_j_jlumin_2011_08_025 crossref_primary_10_1134_S0021364013010086 crossref_primary_10_1103_PhysRevB_83_125115 crossref_primary_10_1088_1742_6596_560_1_012013 crossref_primary_10_3390_ma16247670 crossref_primary_10_1016_j_optmat_2004_11_054 crossref_primary_10_1088_0957_0233_27_6_065004 crossref_primary_10_1002_pssb_201451116 crossref_primary_10_1016_j_jlumin_2006_08_034 crossref_primary_10_1103_PhysRevB_78_045111 crossref_primary_10_1088_0957_0233_26_1_012001 crossref_primary_10_1002_pssc_200673875 crossref_primary_10_1016_j_radmeas_2004_03_012 crossref_primary_10_1134_S0030400X14050178 |
| Cites_doi | 10.1088/0953-8984/9/24/019 10.1103/PhysRevB.65.165214 10.1063/1.336557 10.1103/PhysRevB.64.085107 10.1063/1.117286 10.1063/1.437386 10.1063/1.1695929 |
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| Keywords | Conduction bands Energy levels Photoionization Microwave radiation Dielectric materials Lutetium silicates Doped materials Rare earth additions Laser irradiation Absorption spectra Calcium fluorides |
| Language | English |
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| References | Welber (BIB7) 1965; 42 Raukas, Basun, van Schaik, Yen, Happek (BIB6) 1996; 69 Dujardin, Pédrini, Gâcon, Petrosyan, Belsky, Vasiliev (BIB2) 1997; 9 V.A. Arkhangelskaya, P.P. Feofilov, in: Proc. Intern. on Conf. Luminescense, 1966, Budapest, 1968, p. 1682 Pédrini, McClure, Anderson (BIB3) 1979; 70 Poole (BIB4) 1966 Kazanskii, Rumyantsev, Ryskin (BIB5) 2002; 65 Pédrini, Rogemond, McClure (BIB9) 1986; 59 Thiel, Cruguel, Wu, Sun, Lapeyre, Cone, Equall, Macfarlane (BIB1) 2001; 64 Pédrini (10.1016/S0925-3467(03)00117-4_BIB9) 1986; 59 Thiel (10.1016/S0925-3467(03)00117-4_BIB1) 2001; 64 Raukas (10.1016/S0925-3467(03)00117-4_BIB6) 1996; 69 Kazanskii (10.1016/S0925-3467(03)00117-4_BIB5) 2002; 65 Pédrini (10.1016/S0925-3467(03)00117-4_BIB3) 1979; 70 Poole (10.1016/S0925-3467(03)00117-4_BIB4) 1966 10.1016/S0925-3467(03)00117-4_BIB8 Welber (10.1016/S0925-3467(03)00117-4_BIB7) 1965; 42 Dujardin (10.1016/S0925-3467(03)00117-4_BIB2) 1997; 9 |
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| Snippet | A new technique is presented for measuring the location of the rare earth energy levels with respect to the host conduction band in rare earth doped... |
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| SubjectTerms | Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids; impact phenomena Exact sciences and technology Field emission, ionization, evaporation, and desorption Physics |
| Title | A new microwave resonant technique for studying rare earth photoionization thresholds in dielectric crystals under laser irradiation |
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