Efficient electrochromic nickel oxide thin films by electrodeposition
Nickel oxide (NiO) thin films were prepared by electrodeposition technique onto the fluorine doped tin oxide (FTO) coated glass substrates in one step deposition at 20, 30, 40 and 50 min deposition times respectively. The effect of film thickness (thereby microstructural changes) on their structural...
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Published in: | Journal of alloys and compounds Vol. 489; no. 2; pp. 667 - 673 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Kidlington
Elsevier B.V
21-01-2010
Elsevier |
Subjects: | |
Online Access: | Get full text |
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Summary: | Nickel oxide (NiO) thin films were prepared by electrodeposition technique onto the fluorine doped tin oxide (FTO) coated glass substrates in one step deposition at 20, 30, 40 and 50
min deposition times respectively. The effect of film thickness (thereby microstructural changes) on their structural, morphological, optical and electrochromic properties was investigated. The mass change with potential and cyclic voltammogram was recorded in the range from +0.3 to −0.8
V versus Ag/AgCl. One step deposition of polycrystalline cubic phase NiO was confirmed from X-ray diffraction study. Optical absorption study revealed direct band gap energy of 3.2
eV. The optical transmittance of the film decreased with increase in film thickness. A uniform granular and porous morphology of the films deposited for 20
min was observed. The film becomes more compact and devoid of pores when deposition time was increased to 30
min. Thereafter severe cracks are observed. All the films exhibit anodic electrochromism in OH
− containing electrolyte (0.1
M KOH). The maximum coloration efficiency of 107
cm
2/C and electrochemical stability of up to 10
4 colour/bleach cycles were observed for the films deposited for 20
min (film thickness of 104
nm). |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2009.09.146 |