Measuring AC-loss in high temperature superconducting cable-conductors using four probe methods

• Published in: IEEE transactions on applied superconductivity Vol. 9; no. 2; pp. 1169 - 1172
• Main Authors: Kuhle, A., Traeholt, C., Kruger Olsen, S., Rasmussen, C., Tonnesen, O., Daumling, M.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01-06-1999; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Bi-based cuprates; Cables; Circuit testing; Circuits; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Conductors; Cuprates superconductors (high tc and insulating parent compounds); Disturbances. Regulation. Protection; Electric connection. Cables. Wiring; Electric potential; Electrical engineering. Electrical power engineering; Electrical power engineering; Exact sciences and technology; High temperature superconductors; Joining processes; Laboratories; Measuring instruments; Physics; Power networks and lines; Probes; Size measurement; Superconducting cables; Superconducting films; Superconducting tapes; Superconductivity; Various equipment and components; Voltage; Hysteresis loss; Superconducting cable; Measurement method; Experimental study; Probe; High temperature superconductor; Alternating current
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/77.783507

Measuring the AC-loss of superconducting cable conductors have many aspects in common with measuring the AC-loss of single superconducting tapes. In a cable conductor all tapes are connected to each other and to the test circuit through normal metal joints at each end. This makes such measurements considerably more complex, especially for samples of laboratory scale (1-5 meters). Here we discuss different measurement configurations using four probe methods and lock-in detection. We conclude that the voltage should be picked up at end of the connecting joints, and we show how the resistive contribution from these joints can be identified and subtracted from the measured data. We also show measurements which indicate that the size of the loop constituted by the voltage leads has no influence on the measurements.