The surface enhanced second harmonic generation of light from a randomly rough metal surface in the Kretschmann geometry

• Published in: Optics communications Vol. 183; no. 5; pp. 529 - 545
• Main Authors: Leskova, T.A., Leyva-Lucero, M., Méndez, E.R., Maradudin, A.A., Novikov, I.V.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 15-09-2000; Elsevier Science
• ISSN: 0030-4018; 1873-0310
• DOI: 10.1016/S0030-4018(00)00897-X

We present results of perturbative calculations of the second harmonic light generated in the transmission of
p-polarized light through a thin metal film with a one-dimensional random surface in the Kretschmann attenuated total reflection (ATR) geometry. The metal film is deposited on the planar surface of a prism through which the light is incident. The back surface of the film is a one-dimensional random surface whose generators are perpendicular to the plane of incidence. It is in contact either with a semi-infinite vacuum or with a semi-infinite nonlinear crystal (quartz). It is shown that when the random surface separates the metal film from vacuum so that the nonlinearity of the film surfaces gives rise to the harmonic light, for a general angle of incidence a dip appears in the angular dependence of the intensity of the transmitted harmonic light in the direction normal to the mean surface. When the second harmonic generation is due to the nonlinearity of the crystal in contact with the metal film, a peak in the angular dependence of the intensity of the transmitted harmonic light occurs in this direction. These dips and peaks are multiple-scattering effects. However, when the angle of incidence is optimal for the excitation of surface plasmon polaritons at the film-vacuum/nonlinear crystal interface the nonlinear mixing of the incident light and the backward propagating surface plasmon polariton leads to an intense peak in the angular dependence of the intensity of the transmitted harmonic light in the direction normal to the mean surface. This peak is already present in the single-scattering approximation.