Synthesis and characterization of chromium-containing, thallium-based 1212 films

Epitaxial (Tl,Bi)Sr 2Cr 0.15Ca 0.85Cu 2O y [(Tl,Bi)-1212] films have been successfully grown on both LaAlO 3 and CeO 2/YSZ substrates by post-deposition annealing in flowing argon gas. These superconducting Tl-based, 1212-structured films on LaAlO 3 substrates have T c values in the range of 94–100...

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Published in:Physica. C, Superconductivity Vol. 333; no. 3; pp. 221 - 228
Main Authors: Lao, J.Y., Wang, J.H., Wang, D.Z., Tu, Y., Yang, S.X., Wu, H.L., Ren, Z.F., Verebelyi, D.T., Paranthaman, M., Aytug, T., Christen, D.K., Bhattacharya, R.N., Blaugher, R.D.
Format: Journal Article
Language:English
Published: United States Elsevier B.V 01-01-2000
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Summary:Epitaxial (Tl,Bi)Sr 2Cr 0.15Ca 0.85Cu 2O y [(Tl,Bi)-1212] films have been successfully grown on both LaAlO 3 and CeO 2/YSZ substrates by post-deposition annealing in flowing argon gas. These superconducting Tl-based, 1212-structured films on LaAlO 3 substrates have T c values in the range of 94–100 K, and J c values over 1.0×10 6 A/cm 2 at 77 K. The films are predominately 1212 phase, with excellent epitaxy as determined by XRD θ–2 θ, ω and φ scans. The films on CeO 2/YSZ substrates have T c values in the range of 94–96 K, J c (77 K) values close to 6×10 5 A/cm 2 and excellent epitaxy on the CeO 2 buffer layers.
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content type line 23
P00-107568
USDOE
AC05-00OR22725
ISSN:0921-4534
1873-2143
DOI:10.1016/S0921-4534(00)00230-6