ITO-Schottky photodiodes for high-performance detection in the UV-IR spectrum

High-performance vertically illuminated Schottky photodiodes with indium-tin-oxide (ITO) Schottky layers were designed, fabricated, and tested. Ternary and quarternary III-V material systems (AlGaN-GaN, AlGaAs-GaAs, InAlGaAs-InP, and InGaAsP-InP) were utilized for detection in the ultraviolet (UV) (...

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Bibliographic Details
Published in:IEEE journal of selected topics in quantum electronics Vol. 10; no. 4; pp. 759 - 765
Main Authors: Biyikli, N., Kimukin, I., Butun, B., Aytur, O., Ozbay, E.
Format: Journal Article
Language:English
Published: New York IEEE 01-07-2004
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:High-performance vertically illuminated Schottky photodiodes with indium-tin-oxide (ITO) Schottky layers were designed, fabricated, and tested. Ternary and quarternary III-V material systems (AlGaN-GaN, AlGaAs-GaAs, InAlGaAs-InP, and InGaAsP-InP) were utilized for detection in the ultraviolet (UV) (/spl lambda/<400 nm), near-IR (/spl lambda//spl sim/850 nm), and IR (/spl lambda//spl sim/1550 nm) spectrum. The material properties of thin ITO films were characterized. Using resonant-cavity-enhanced (RCE) detector structures, improved efficiency performance was achieved. Current-voltage, spectral responsivity, and high-speed measurements were carried out on the fabricated ITO-Schottky devices. The device performances obtained with different material systems are compared.
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ISSN:1077-260X
1558-4542
DOI:10.1109/JSTQE.2004.833977