YBaCuO mid-infrared bolometers: Substrate influence on inter-pixel crosstalk
A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal crosstalk between adjacent pixels. Two models are described, a 2D analytic model and a 3D numerical model. The latter takes into consideration...
Saved in:
Published in: | IEEE transactions on applied superconductivity Vol. 11; no. 1; pp. 766 - 769 |
---|---|
Main Authors: | , , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
New York, NY
IEEE
01-03-2001
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Abstract | A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal crosstalk between adjacent pixels. Two models are described, a 2D analytic model and a 3D numerical model. The latter takes into consideration the thermal boundary resistance between the substrate and the heat sink. The predicted responses are compared with those of a 2/spl times/2 YBaCuO bolometer array deposited on MgO substrate and tested at 10 /spl mu/m wavelength. |
---|---|
AbstractList | A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal crosstalk between adjacent pixels. Two models are described, a 2D analytic model and a 3D numerical model. The latter takes into consideration the thermal boundary resistance between the substrate and the heat sink. The predicted responses are compared with those of a 2x2 YBaCuO bolometer array deposited on MgO substrate and tested at 10 mum wavelength A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal crosstalk between adjacent pixels. Two models are described, a 2D analytic model and a 3D numerical model. The latter takes into consideration the thermal boundary resistance between the substrate and the heat sink. The predicted responses are compared with those of a 2x2 YBaCuO bolometer array deposited on MgO substrate and tested at 10 mu m wavelength. A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal crosstalk between adjacent pixels. Two models are described, a 2D analytic model and a 3D numerical model. The latter takes into consideration the thermal boundary resistance between the substrate and the heat sink. The predicted responses are compared with those of a 2/spl times/2 YBaCuO bolometer array deposited on MgO substrate and tested at 10 /spl mu/m wavelength. |
Author | Klisnick, G. De Luca, A. Teste, P. Kreisler, A. Redon, M. Voisin, F. Gensbittel, A. Gaugue, A. Delerue, J. |
Author_xml | – sequence: 1 givenname: A. surname: Gaugue fullname: Gaugue, A. organization: CNRS, Gif-sur-Yvette, France – sequence: 2 givenname: P. surname: Teste fullname: Teste, P. – sequence: 3 givenname: J. surname: Delerue fullname: Delerue, J. – sequence: 4 givenname: A. surname: Gensbittel fullname: Gensbittel, A. – sequence: 5 givenname: A. surname: De Luca fullname: De Luca, A. – sequence: 6 givenname: A. surname: Kreisler fullname: Kreisler, A. – sequence: 7 givenname: F. surname: Voisin fullname: Voisin, F. – sequence: 8 givenname: G. surname: Klisnick fullname: Klisnick, G. – sequence: 9 givenname: M. surname: Redon fullname: Redon, M. |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=981449$$DView record in Pascal Francis |
BookMark | eNqFkM9LwzAUx4NMcJsevHoqCoKHzpc0aRJvOvwFgx3Ug6eSpq_Q2bUzaUH_ezM7FLx4enn5fvIN3--EjJq2QUKOKcwoBX0p5UxTzYXaI2MqhIqZoGIUziBorBhLDsjE-xUA5YqLMVm83ph5v4zWVRFXTemMwyLK27pdY4fOX0VPfe47ZzqMglz32FiM2iYsQY431QfWkXWt952p3w7Jfmlqj0e7OSUvd7fP84d4sbx_nF8vYpukSRcjcFtCjqVISgCTp6kspC4SnecJKM21CEoari0rVAopWgOgQVGrmGJUJlNyPvhuXPveo--ydeUt1rVpsO19xpSknHL4H5Sw5VgAT_-Aq7Z3TQiRaZ2kjFK2_fZigL4DOyyzjavWxn1mFLJt-5mU2dB-YM92hsZbU4diG1v5nwdaUc51oE4GqkLEX3Gw-AJMuYvb |
CODEN | ITASE9 |
CitedBy_id | crossref_primary_10_1016_j_apsusc_2014_11_119 crossref_primary_10_1109_TASC_2009_2019285 crossref_primary_10_1109_TASC_2005_861040 crossref_primary_10_1088_0953_2048_19_6_032 crossref_primary_10_1109_TASC_2006_881820 crossref_primary_10_1209_0295_5075_127_60002 crossref_primary_10_1109_TASC_2003_813674 |
Cites_doi | 10.1016/0921-4534(94)91220-3 10.1016/S1350-4495(96)00011-4 10.1063/1.346996 10.1109/77.621716 10.1088/0953-2048/13/8/321 |
ContentType | Journal Article Conference Proceeding |
Copyright | 2001 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001 |
Copyright_xml | – notice: 2001 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001 |
DBID | RIA RIE IQODW AAYXX CITATION 7SP 7U5 8FD L7M |
DOI | 10.1109/77.919458 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library Online Pascal-Francis CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
DatabaseTitleList | Technology Research Database Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics Applied Sciences |
EISSN | 1558-2515 |
EndPage | 769 |
ExternalDocumentID | 2632012771 10_1109_77_919458 981449 919458 |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ DU5 EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PZZ RIA RIE RIG RNS TN5 VH1 XFK ABPTK IQODW AAYXX CITATION 7SP 7U5 8FD L7M |
ID | FETCH-LOGICAL-c363t-e04cf0bef53f00ab667d79d39bb3089495f536b66c2d8606eca009081c8282173 |
IEDL.DBID | RIE |
ISSN | 1051-8223 |
IngestDate | Fri Aug 16 07:13:39 EDT 2024 Fri Aug 16 01:19:39 EDT 2024 Thu Oct 10 19:20:59 EDT 2024 Fri Aug 23 03:30:48 EDT 2024 Sun Oct 22 16:08:19 EDT 2023 Wed Jun 26 19:28:36 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | The 2000 Applied Superconductivity Conference, Virginia Beach, VA, September 17-22, 2000. Part I |
MergedId | FETCHMERGED-LOGICAL-c363t-e04cf0bef53f00ab667d79d39bb3089495f536b66c2d8606eca009081c8282173 |
Notes | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
PQID | 993621127 |
PQPubID | 23500 |
PageCount | 4 |
ParticipantIDs | crossref_primary_10_1109_77_919458 proquest_miscellaneous_28714140 proquest_journals_993621127 pascalfrancis_primary_981449 proquest_miscellaneous_27041402 ieee_primary_919458 |
PublicationCentury | 2000 |
PublicationDate | 2001-03-01 |
PublicationDateYYYYMMDD | 2001-03-01 |
PublicationDate_xml | – month: 03 year: 2001 text: 2001-03-01 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY – name: New York |
PublicationTitle | IEEE transactions on applied superconductivity |
PublicationTitleAbbrev | TASC |
PublicationYear | 2001 |
Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref1 ref4 voisin (ref6) 2000 ref3 depond (ref5) 1994 li (ref2) 1997; 7 |
References_xml | – start-page: 131 year: 2000 ident: ref6 article-title: a low noise cryogenic cmos readout circuit for a 4-pixel superconducting infrared bolometer array publication-title: Proc 4th European Workshop on Low Temperature Electronics (WOLTE 4) contributor: fullname: voisin – start-page: 3387 year: 1994 ident: ref5 article-title: theory and implementation of economical ybacuo bolometers at 10.6 µm wavelength publication-title: Physica C235-240 doi: 10.1016/0921-4534(94)91220-3 contributor: fullname: depond – ident: ref3 doi: 10.1016/S1350-4495(96)00011-4 – ident: ref4 doi: 10.1063/1.346996 – volume: 7 start-page: 2371 year: 1997 ident: ref2 article-title: high tc gdba2cuo3 o7-∂ superconducting thin film bolometers publication-title: IEEE Trans Appl Supercondut doi: 10.1109/77.621716 contributor: fullname: li – ident: ref1 doi: 10.1088/0953-2048/13/8/321 |
SSID | ssj0014845 |
Score | 1.6689095 |
Snippet | A theoretical modelling approach has been developed, allowing the prediction of the response of YBaCuO bolometers forming an elementary array and the thermal... |
SourceID | proquest crossref pascalfrancis ieee |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 766 |
SubjectTerms | Applied sciences Bolometers Crosstalk Electronics Exact sciences and technology Predictive models Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Substrates Superconducting devices Superconducting films Superconducting photodetectors Temperature sensors Testing Thermal resistance Yttrium barium copper oxide |
Title | YBaCuO mid-infrared bolometers: Substrate influence on inter-pixel crosstalk |
URI | https://ieeexplore.ieee.org/document/919458 https://www.proquest.com/docview/993621127 https://search.proquest.com/docview/27041402 https://search.proquest.com/docview/28714140 |
Volume | 11 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSyQxEC4cQdDDqrOKs77C4jWa6XR3Em8-8SC7h1XQU5Oka2BQe2Tahv35W0lPj8qK4K3JA9JVSeX7kkoVwIElCJxZZ7m2MiGCYgx3KkGeDsssszITuQ_nHVd_1K87fX6RdnG241sYRIzOZ3gYPuNdfjnxTTgqOzLEuDPdg54yun2qNb8wSHXMR0xoYchpz5OzIEJDYY6UOmw7vtt6Yi6V4AlpaxLGqM1i8Z9BjrvM5eqXxrcG32Zgkp202l-HBaz6sPImxGAflqKLp6-_w_X9qT1rfrOncclpWk2D5zlzZPuegkdMfcyCDYmxatm4y1zCJhULASWm_Hn8Fx9Z_DGC6w8bcHt5cXN2xWe5FLiXuXzhKFI_Eg5HmRwJYV2eq1KZUhrnpNCGaBLV5FTsk1ITqUFvCX0RXvBEyYi2yE1YrCYVbgErfaJzFC71wqdDtE7aXKPOHHFaJdEP4Gcn5uK5DZlRRKohTKFU0QppAP0gv3mDrnTnnT5eqzURPzOA7U49xWyp1QUBrJxYbKIGsD-vpTUSLj5shZOmLhIlUiKSySctiDeGJj8-HNY2LL-6nu3A4su0wV3o1WWzF2fhP8uP23Q |
link.rule.ids | 310,311,315,782,786,791,792,798,23941,23942,25151,27935,27936,54770 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3fT9swED4Npgl4YKMMUWDDmng1uHES23sbDNRpHXsYSOMpsp2rVA1S1BCJP5-z0xTQJqS9Rf4hOXf2-fvs8x3AgSUInFlnubYyIYJiDHcqQZ4OyiyzMhO5D-cdw1_q_Lf-epp2cbbjWxhEjM5neBg-411-OfVNOCo7MsS4M70Er7NUKdE-1lpcGaQ6ZiQmvDDgtOvJeRihgTBHSh22XZ9tPjGbSvCFtDWJY9zmsfjLJMd95uztf43wHazP4ST70up_A15h1YO1J0EGe_AmOnn6ehNGV8f2pPnJbiYlp4k1C77nzJH1uwk-MfVnFqxIjFbLJl3uEjatWAgpMeO3k3u8ZvHHCLD_eQ-XZ6cXJ0M-z6bAvczlHUeR-rFwOM7kWAjr8lyVypTSOCeFNkSUqCanYp-UmmgNekv4ixCDJ1JGxEVuwXI1rXAbWOkTnaNwqRc-HaB10uYadeaI1SqJvg-fOjEXt23QjCKSDWEKpYpWSH3oBfktGnSle8_08VitifqZPux26inmi60uCGLlxGMT1Yf9RS2tknD1YSucNnWRKJESlUxeaEHMMTTZ-eew9mFlePFjVIy-nX_fhdVHR7Q9WL6bNfgBluqy-Rhn5ANq3t6_ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IEEE+transactions+on+applied+superconductivity&rft.atitle=YBaCuO+mid-infrared+bolometers+%3A+Substrate+influence+on+inter-pixel+crosstalk&rft.au=GAUGUE%2C+A&rft.au=TESTE%2C+P&rft.au=DELERUE%2C+J&rft.au=GENSBITTEL%2C+A&rft.date=2001-03-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=1051-8223&rft.eissn=1558-2515&rft.volume=11&rft.issue=1&rft.spage=766&rft.epage=769&rft_id=info:doi/10.1109%2F77.919458&rft.externalDBID=n%2Fa&rft.externalDocID=981449 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-8223&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-8223&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-8223&client=summon |