A Review of Aging Models for Electrical Insulation in Power Cables
Electrical insulation is an integral part of power components. The aging of electrical insulation is an undeniable fact that limits the operational lifetime of power components. Apart from regular aging, abnormal stresses and the development of defects are real threats because of their contribution...
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| Published in: | Energies (Basel) Vol. 15; no. 9; p. 3408 |
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| Language: | English |
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01-05-2022
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| Abstract | Electrical insulation is an integral part of power components. The aging of electrical insulation is an undeniable fact that limits the operational lifetime of power components. Apart from regular aging, abnormal stresses and the development of defects are real threats because of their contribution in accelerating the aging rate and thereby leading to a premature failure of the power components. Over the decades, various studies have been carried out to understand the aging behavior of electrical insulation mainly considering electrical and thermal stresses. Similarly, a number of mathematical (aging) models have been developed based on the theoretical and experimental investigations and evidences. However, a dependable formulation of the models that can provide more practical estimation of the insulation degradation profile has not been achieved yet. This paper presents a comprehensive review of the aging models considering single and multistress conditions. Further, the paper discusses possible challenges and barricades averting the conventional models to achieve a suitable accuracy. Finally, suggestions are provided that can be considered to improve the modeling approaches and their performance. |
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| AbstractList | Electrical insulation is an integral part of power components. The aging of electrical insulation is an undeniable fact that limits the operational lifetime of power components. Apart from regular aging, abnormal stresses and the development of defects are real threats because of their contribution in accelerating the aging rate and thereby leading to a premature failure of the power components. Over the decades, various studies have been carried out to understand the aging behavior of electrical insulation mainly considering electrical and thermal stresses. Similarly, a number of mathematical (aging) models have been developed based on the theoretical and experimental investigations and evidences. However, a dependable formulation of the models that can provide more practical estimation of the insulation degradation profile has not been achieved yet. This paper presents a comprehensive review of the aging models considering single and multistress conditions. Further, the paper discusses possible challenges and barricades averting the conventional models to achieve a suitable accuracy. Finally, suggestions are provided that can be considered to improve the modeling approaches and their performance. |
| Author | Kiitam, Ivar Hussain, Amjad Taklaja, Paul Shafiq, Muhammad Palu, Ivo Choudhary, Maninder |
| Author_xml | – sequence: 1 givenname: Maninder orcidid: 0000-0002-6251-9911 surname: Choudhary fullname: Choudhary, Maninder – sequence: 2 givenname: Muhammad orcidid: 0000-0002-2272-0899 surname: Shafiq fullname: Shafiq, Muhammad – sequence: 3 givenname: Ivar surname: Kiitam fullname: Kiitam, Ivar – sequence: 4 givenname: Amjad orcidid: 0000-0002-5161-7233 surname: Hussain fullname: Hussain, Amjad – sequence: 5 givenname: Ivo surname: Palu fullname: Palu, Ivo – sequence: 6 givenname: Paul surname: Taklaja fullname: Taklaja, Paul |
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| CitedBy_id | crossref_primary_10_55581_ejeas_1398578 crossref_primary_10_1016_j_engfailanal_2023_107222 crossref_primary_10_3390_en15218108 crossref_primary_10_1007_s00202_023_01935_y crossref_primary_10_3390_electronics13061085 crossref_primary_10_3390_pr10102009 crossref_primary_10_1016_j_epsr_2022_108943 crossref_primary_10_15407_techned2023_01_003 crossref_primary_10_3390_en16124803 crossref_primary_10_3390_en17091987 crossref_primary_10_1016_j_engfailanal_2024_108006 crossref_primary_10_1049_hve2_12431 |
| Cites_doi | 10.1007/s13320-014-0146-7 10.1049/hve.2017.0037 10.1109/TEI.1979.298226 10.1109/TPAS.1982.317185 10.1088/0022-3727/23/12/016 10.1109/EIC.1962.7466672 10.1109/TDEI.1995.8881933 10.1109/TEI.1985.348759 10.1109/14.2391 10.1049/hve.2020.0009 10.1109/TEI.1981.298361 10.1109/14.19877 10.3390/polym13162688 10.1109/14.236212 10.1109/ICHVEPS47643.2019.9011113 10.3390/polym14030431 10.1002/047134608X.W2820 10.1109/TDEI.2021.009400 10.1109/94.822029 10.1109/TDEI.2005.1522183 10.1109/94.407031 10.3390/en13164272 10.1109/ICEI.1980.7470860 10.1109/57.901613 10.1109/14.108148 10.1109/94.625642 10.1109/TPWRD.1987.4308151 10.1016/j.epsr.2018.10.038 10.1109/TEI.1971.299172 10.1109/MEI.2008.4591433 10.1109/14.237740 10.1109/MEI.2010.5511187 10.1109/TEI.1987.298936 10.1109/57.776939 10.1109/JSEN.2015.2474122 10.1109/TEI.1978.298079 10.1109/94.536736 10.1109/ICELMACH.2016.7732847 10.1109/14.237742 10.1109/14.59867 10.1109/94.556559 10.1109/61.568220 10.1016/B978-081551551-7.50006-1 10.1109/ELINSL.2012.6251546 10.1109/TEI.1984.298732 |
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| References | ref_50 Montanari (ref_53) 1987; 2 Sanche (ref_64) 1993; 28 ref_56 ref_11 ref_55 ref_10 Densley (ref_7) 2001; 17 ref_19 Mazzanti (ref_52) 1997; 12 ref_17 ref_16 Dakin (ref_5) 1948; 67 ref_15 Montanari (ref_59) 1989; 24 Montanari (ref_61) 1995; 2 Montsinger (ref_45) 1930; 49 Cacciari (ref_58) 1990; 23 ref_25 ref_24 ref_68 ref_22 Fisher (ref_36) 2021; 28 ref_65 ref_63 Dissado (ref_33) 1995; 2 Ramu (ref_54) 1985; EI-20 Srinivasan (ref_12) 2012; 55 ref_28 Shafiq (ref_14) 2019; 167 ref_26 Simoni (ref_32) 1993; 28 Simoni (ref_31) 1984; 19 Higinbotham (ref_21) 2018; 1 ref_70 Hussain (ref_29) 2015; 15 Dissado (ref_66) 1997; 4 Choudhary (ref_18) 2018; 4 ref_35 ref_34 Garros (ref_3) 1999; 15 Stone (ref_39) 1979; 14 Cacciari (ref_57) 1991; 26 Simoni (ref_49) 1988; 23 Bahadoorsingh (ref_13) 2008; 24 Montanari (ref_43) 1993; 28 ref_38 Nelson (ref_51) 1971; 6 ref_37 Brancato (ref_46) 1978; 13 Su (ref_23) 2020; 5 Hirose (ref_44) 1987; 22 Cavallini (ref_69) 2010; 26 Simoni (ref_30) 1981; 16 Montanari (ref_27) 1996; 3 ref_47 Bahder (ref_60) 1982; 101 Mazzanti (ref_6) 2005; 12 Zhou (ref_20) 2017; 2 ref_42 ref_41 ref_1 Mazzanti (ref_67) 1999; 6 ref_2 Zhang (ref_62) 1996; 3 ref_48 ref_8 Cygan (ref_40) 1990; 25 ref_4 Yaacob (ref_9) 2014; 4 |
| References_xml | – volume: 4 start-page: 325 year: 2014 ident: ref_9 article-title: Review on partial discharge detection techniques related to high voltage power equipment using different sensors publication-title: Photon Sens. doi: 10.1007/s13320-014-0146-7 contributor: fullname: Yaacob – volume: 2 start-page: 179 year: 2017 ident: ref_20 article-title: Review of Recent Research Towards Power Cable Life Cycle Management publication-title: High Volt. doi: 10.1049/hve.2017.0037 contributor: fullname: Zhou – volume: 55 start-page: 43 year: 2012 ident: ref_12 article-title: Prediction of Transformer Insulation Life with an Effect of Environmental Variables publication-title: Int. J. Comput. Appl. contributor: fullname: Srinivasan – ident: ref_26 – volume: 14 start-page: 233 year: 1979 ident: ref_39 article-title: The Application of Weibull Statistics to Insulation Aging Tests publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1979.298226 contributor: fullname: Stone – volume: 101 start-page: 1379 year: 1982 ident: ref_60 article-title: Physical Model of Electric Aging and Breakdown of Extruded Pplymeric Insulated Power Cables publication-title: IEEE Trans. Power Appar. Syst. doi: 10.1109/TPAS.1982.317185 contributor: fullname: Bahder – ident: ref_68 – volume: 23 start-page: 1592 year: 1990 ident: ref_58 article-title: Probabilistic models for life prediction of insulating materials publication-title: J. Phys. D Appl. Phys. doi: 10.1088/0022-3727/23/12/016 contributor: fullname: Cacciari – ident: ref_65 – ident: ref_48 doi: 10.1109/EIC.1962.7466672 – ident: ref_42 – volume: 2 start-page: 1147 year: 1995 ident: ref_33 article-title: The incorporation of space charge degradation in the life model for electrical insulating materials publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.1995.8881933 contributor: fullname: Dissado – ident: ref_35 – volume: EI-20 start-page: 70 year: 1985 ident: ref_54 article-title: On the estimation of life of power apparatus insulation under combined electrical and thermal stress publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1985.348759 contributor: fullname: Ramu – ident: ref_8 – ident: ref_4 – volume: 23 start-page: 489 year: 1988 ident: ref_49 article-title: Application of a new geometrical approach to determination of combined stress endurance of insulating materials publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.2391 contributor: fullname: Simoni – ident: ref_56 – volume: 5 start-page: 353 year: 2020 ident: ref_23 article-title: Electrical tree degradation in high-voltage cable insulation: Progress and challenges publication-title: High Volt. doi: 10.1049/hve.2020.0009 contributor: fullname: Su – volume: 16 start-page: 277 year: 1981 ident: ref_30 article-title: A General Approach to the Endurance of Electrical Insulation under Temperature and Voltage publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1981.298361 contributor: fullname: Simoni – volume: 24 start-page: 127 year: 1989 ident: ref_59 article-title: A probabilistic life model for insulating materials showing electrical thresholds publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.19877 contributor: fullname: Montanari – ident: ref_70 doi: 10.3390/polym13162688 – volume: 28 start-page: 349 year: 1993 ident: ref_32 article-title: A general multi-stress life model for insulating materials with or without evidence for thresholds publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.236212 contributor: fullname: Simoni – ident: ref_11 doi: 10.1109/ICHVEPS47643.2019.9011113 – ident: ref_1 doi: 10.3390/polym14030431 – ident: ref_38 – ident: ref_55 doi: 10.1002/047134608X.W2820 – ident: ref_17 – volume: 28 start-page: 972 year: 2021 ident: ref_36 article-title: Initiation and Growth of the Secondary Electron Avalanche along High-Gradient Insulators in Vacuum publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2021.009400 contributor: fullname: Fisher – volume: 6 start-page: 864 year: 1999 ident: ref_67 article-title: A space-charge life model for ac electrical aging of polymers publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.822029 contributor: fullname: Mazzanti – volume: 12 start-page: 876 year: 2005 ident: ref_6 article-title: Electrical aging and life models: The role of space charge publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2005.1522183 contributor: fullname: Mazzanti – volume: 2 start-page: 667 year: 1995 ident: ref_61 article-title: Aging and life models for insulation systems based on PD detection publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.407031 contributor: fullname: Montanari – ident: ref_28 – ident: ref_16 doi: 10.3390/en13164272 – ident: ref_41 doi: 10.1109/ICEI.1980.7470860 – volume: 17 start-page: 14 year: 2001 ident: ref_7 article-title: Ageing mechanisms and diagnostics for power cables—An overview publication-title: IEEE Electr. Insul. Mag. doi: 10.1109/57.901613 contributor: fullname: Densley – ident: ref_34 – volume: 26 start-page: 1112 year: 1991 ident: ref_57 article-title: Optimum design of life tests for insulating materials, systems and components publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.108148 contributor: fullname: Cacciari – volume: 4 start-page: 496 year: 1997 ident: ref_66 article-title: The role of trapped space charges in the electrical aging of insulating materials publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.625642 contributor: fullname: Dissado – ident: ref_47 – volume: 2 start-page: 596 year: 1987 ident: ref_53 article-title: Long—Term Behavior of XLPE Insulated Cable Models publication-title: IEEE Trans. Power Deliv. doi: 10.1109/TPWRD.1987.4308151 contributor: fullname: Montanari – ident: ref_37 – ident: ref_63 – volume: 167 start-page: 150 year: 2019 ident: ref_14 article-title: Online condition monitoring of MV cable feeders using Rogowski coil sensors for PD measurements publication-title: Electr. Power Syst. Res. doi: 10.1016/j.epsr.2018.10.038 contributor: fullname: Shafiq – volume: 6 start-page: 165 year: 1971 ident: ref_51 article-title: Analysis of Accelerated Life Test Data—Part I: The Arrhenius Model and Graphical Methods publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1971.299172 contributor: fullname: Nelson – volume: 24 start-page: 38 year: 2008 ident: ref_13 article-title: A Framework Linking Knowledge of Insulation Aging to Asset Management publication-title: IEEE Electr. Insul. Mag. doi: 10.1109/MEI.2008.4591433 contributor: fullname: Bahadoorsingh – volume: 67 start-page: 113 year: 1948 ident: ref_5 article-title: Electrical Insulation Deterioration Treated as a Chemical Rate Phenomenon publication-title: Cond. Affect. Success Main Line Electrif. contributor: fullname: Dakin – volume: 28 start-page: 755 year: 1993 ident: ref_43 article-title: Aging phenomenology and modeling publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.237740 contributor: fullname: Montanari – volume: 26 start-page: 33 year: 2010 ident: ref_69 article-title: Power electronics and electrical insulation systems—Part 2: Life modeling for insulation design publication-title: IEEE Electr. Insul. Mag. doi: 10.1109/MEI.2010.5511187 contributor: fullname: Cavallini – volume: 22 start-page: 745 year: 1987 ident: ref_44 article-title: A Method to Estimate the Lifetime of Solid Electrical Insulation publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1987.298936 contributor: fullname: Hirose – volume: 15 start-page: 10 year: 1999 ident: ref_3 article-title: Ageing and reliability testing and monitoring of power cables: Diagnosis for insulation systems: The ARTEMIS program publication-title: IEEE Electr. Insul. Mag. doi: 10.1109/57.776939 contributor: fullname: Garros – volume: 15 start-page: 7262 year: 2015 ident: ref_29 article-title: Online Condition Monitoring of MV Switchgear Using D-Dot Sensor to Predict Arc-Faults publication-title: IEEE Sens. J. doi: 10.1109/JSEN.2015.2474122 contributor: fullname: Hussain – volume: 49 start-page: 776 year: 1930 ident: ref_45 article-title: Loading Transformers by Temperature publication-title: Cond. Affect. Success Main Line Electrif. contributor: fullname: Montsinger – volume: 13 start-page: 308 year: 1978 ident: ref_46 article-title: Insulation Aging a Historical and Critical Review publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1978.298079 contributor: fullname: Brancato – volume: 3 start-page: 561 year: 1996 ident: ref_27 article-title: Short-term thermal endurance characterization of polymeric cable insulating materials. Use of oxidative stability measurements publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.536736 contributor: fullname: Montanari – ident: ref_25 – ident: ref_50 – ident: ref_10 doi: 10.1109/ICELMACH.2016.7732847 – volume: 28 start-page: 789 year: 1993 ident: ref_64 article-title: Electronic aging and related electron interactions in thin-film dielectrics publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.237742 contributor: fullname: Sanche – volume: 4 start-page: 27 year: 2018 ident: ref_18 article-title: Condition Assessment of Synchronous Generator Using Fuzzy Logic publication-title: IEET Int. Electr. Eng. Trans. contributor: fullname: Choudhary – ident: ref_15 – volume: 25 start-page: 923 year: 1990 ident: ref_40 article-title: Models for insulation aging under electrical and thermal multistress publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/14.59867 contributor: fullname: Cygan – volume: 1 start-page: 17 year: 2018 ident: ref_21 article-title: Review of Medium-Voltage Asset Failure Investigations publication-title: Prem. Electr. Maint. Saf. Event contributor: fullname: Higinbotham – volume: 3 start-page: 778 year: 1996 ident: ref_62 article-title: Evidence of strong correlation between space-charge buildup and breakdown in cable insulation publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.556559 contributor: fullname: Zhang – volume: 12 start-page: 15 year: 1997 ident: ref_52 article-title: A comparison between XLPE and EPR as insulating materials for HV cables publication-title: IEEE Trans. Power Deliv. doi: 10.1109/61.568220 contributor: fullname: Mazzanti – ident: ref_2 doi: 10.1016/B978-081551551-7.50006-1 – ident: ref_19 – ident: ref_22 – ident: ref_24 doi: 10.1109/ELINSL.2012.6251546 – volume: 19 start-page: 45 year: 1984 ident: ref_31 article-title: General Equation of the Decline in the Electric Strength for Combined Thermal and Electrical Stresses publication-title: IEEE Trans. Electr. Insul. doi: 10.1109/TEI.1984.298732 contributor: fullname: Simoni |
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| Title | A Review of Aging Models for Electrical Insulation in Power Cables |
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