A Comparative Analysis of 3D Software for Modeling Fatigue Crack Growth: A Review
Fatigue crack growth modeling is critical for assessing structural integrity in various engineering applications. Researchers and engineers rely on 3D software tools to predict crack propagation accurately. However, choosing the right software can be challenging due to the plethora of available opti...
Saved in:
Published in: | Applied sciences Vol. 14; no. 5; p. 1848 |
---|---|
Main Authors: | , |
Format: | Journal Article |
Language: | English |
Published: |
Basel
MDPI AG
01-03-2024
|
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | Fatigue crack growth modeling is critical for assessing structural integrity in various engineering applications. Researchers and engineers rely on 3D software tools to predict crack propagation accurately. However, choosing the right software can be challenging due to the plethora of available options. This study aimed to systematically compare and evaluate the suitability of seven prominent 3D modeling software packages for fatigue crack growth analysis in specific applications. The selected software tools, namely ABAQUS, FRANC3D, ZENCRACK, LYNX, FEMFAT, COMSOL Multiphysics, and ANSYS, were subjected to a comprehensive analysis to assess their effectiveness in accurately predicting crack propagation. Additionally, this study aimed to highlight the distinctive features and limitations associated with each software package. By conducting this systematic comparison, researchers and engineers can gain valuable insights into the strengths and weaknesses of these software tools, enabling them to make informed decisions when choosing the most appropriate software for their fatigue crack growth analysis needs. Such evaluations contribute to advancing the field by enhancing the understanding and utilization of these 3D modeling software packages, ultimately improving the accuracy and reliability of structural integrity assessments in relevant applications. |
---|---|
ISSN: | 2076-3417 2076-3417 |
DOI: | 10.3390/app14051848 |