Radiation effects in new materials for nano-devices

• Published in: Microelectronic engineering Vol. 88; no. 7; pp. 1259 - 1264
• Main Authors: Schrimpf, R.D., Fleetwood, D.M., Alles, M.L., Reed, R.A., Lucovsky, G., Pantelides, S.T.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01-07-2011; Elsevier
• Subjects: Applied sciences; Catastrophic failure analysis; Condensed matter: structure, mechanical and thermal properties; Defects; Degradation; Electronic devices; Electronics; Exact sciences and technology; Fractures; Materials; Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology; Metals. Metallurgy; Microelectronics; Molecular electronics, nanoelectronics; Nanocomposites; Nanocrystalline materials; Nanomaterials; Nanostructure; Physics; Radiation effects; Radiation effects on specific materials; Reliability; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Single event effects; Structure of solids and liquids; crystallography; Total dose; Radiation effects; Reliability; Total dose; Materials; Single event effects; Defects; Single event upset; Failures; Nanoelectronics; Electronic component; Radiation effect; Defect; Radiation damage; Damaging
• ISSN: 0167-9317; 1873-5568
• DOI: 10.1016/j.mee.2011.03.117

Introduction of new materials and device structures has a significant impact on radiation response. For some devices, the response may be dominated by the surrounding materials (e.g., the substrate). Use of thinner dielectrics reduces radiation-induced charge generation, but new materials may trap a higher fraction of the charge.
[Display omitted]
► Introduction of new materials creates new radiation-effects challenges. ► Small feature sizes increase susceptibility to radiation-induced transients. ► Radiation response of nanoscale devices may be dominated by the substrate.
Exposure to radiation poses significant challenges for electronic devices, including parametric degradation, loss of data, or catastrophic failure. The challenges and solutions change significantly as new materials are introduced and feature sizes become smaller. This paper reviews the effects of radiation on electronics, with emphasis on the impact of new materials.