Comparison of secondary electron emission simulation to experiment

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 639; no. 1; pp. 155 - 157
• Main Authors: Insepov, Z., Ivanov, V., Jokela, S.J., Veryovkin, I., Zinovev, A., Frisch, H.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 21-05-2011
• Subjects: Accelerators; Argon; Computer simulation; Detectors; Electron emission; Emissivity; Gold; Materials selection; Monte Carlo methods; Monte Carlo simulation; Secondary electron emission; Gold; Monte Carlo simulation; Secondary electron emission
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2010.10.048

Monte Carlo simulation, empirical theories, and close comparison to experiment were used to parameterize the secondary electron emission (SEE) yields of several highly emissive materials for microchannel plates. In addition, a detailed experiment and analysis of gold were carried out at Argonne National Laboratory. The simulation results will be used in the selection of emissive and resistive materials for deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne.