Bent crystal Laue analyser combined with total reflection fluorescence X‐ray absorption fine structure (BCLA + TRF‐XAFS) and its application to surface studies

A bent crystal Laue analyser (BCLA) is an X‐ray energy analyser used for fluorescence X‐ray absorption fine‐structure (XAFS) spectroscopy to separate the fluorescence X‐ray emission line of a target atom from the elastic scattering X‐rays and other fluorescence emission lines. Here, the feasibility...

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Bibliographic Details
Published in:	Journal of synchrotron radiation Vol. 27; no. 6; pp. 1618 - 1625
Main Authors:	Wakisaka, Yuki, Hu, Bing, Kido, Daiki, Al Rashid, Md. Harun, Chen, Wenhan, Dong, Kaiyue, Wada, Takahiro, Bharate, Bapurao, Yuan, Quiyi, Mukai, Shingo, Takeichi, Yasuo, Takakusagi, Satoru, Asakura, Kiyotaka
Format:	Journal Article
Language:	English
Published:	5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01-11-2020 John Wiley & Sons, Inc
Subjects:	Absorption bent crystal Laue analyser Elastic scattering Fine structure Fluorescence Footprints Gold in situ surface X‐ray absorption fine structure Metal foils Platinum Reflection Spectrum analysis Substrates Surface analysis (chemical) Surface chemistry total reflection fluorescence X‐ray absorption fine structure X‐ray absorption fine structure
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