Low-cost microoptical modules for MCM level optical interconnections
A multichannel free-space microoptical module for dense MCM-level optical interconnections has been designed and fabricated. Extensive modeling proves that the module is scalable with a potential for multi-Tb/s/spl middot/cm/sup 2/ aggregate bit rate capacity while alignment and fabrication toleranc...
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Published in: | IEEE journal of selected topics in quantum electronics Vol. 9; no. 2; pp. 518 - 530 |
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Main Authors: | , , , , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
IEEE
01-03-2003
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
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Summary: | A multichannel free-space microoptical module for dense MCM-level optical interconnections has been designed and fabricated. Extensive modeling proves that the module is scalable with a potential for multi-Tb/s/spl middot/cm/sup 2/ aggregate bit rate capacity while alignment and fabrication tolerances are compatible with present-day mass replication techniques. The microoptical module is an assembly of refractive lenslet-arrays and a high-quality microprism. Both components are prototyped using deep lithography with protons and are monolithically integrated using a vacuum casting replication technique. The resulting 16-channel high optical-grade plastic module shows optical transfer efficiencies of 46% and inter-channel cross talks as low as -22 dB, sufficient to establish workable multichannel MCM-level interconnections. This microoptical module was used in a feasibility demonstrator to establish intra-chip optical interconnections on a 0.6 /spl mu/m CMOS optoelectronic field programmable gate array. This optoelectronic chip combines fully functional digital logic, driver and receiver circuitry and flip-chipped VCSEL and detector arrays. With this test-vehicle multichannel on-chip data-communication has been achieved for the first time to our knowledge. The bit rate per channel was limited to 10 Mb/s because of the limited speed of the chip tester. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ISSN: | 1077-260X 1558-4542 |
DOI: | 10.1109/JSTQE.2003.813316 |