Incident angle-dependent effective surface impedance (Z/sub S/) of Electromagnetic Crystal (EMXT)

Electromagnetic crystal (EMXT) surfaces are modeled with effective surface impedance method. Effects of oblique incidence are studied using a technique similar to the waveguide simulator method for analyzing infinite phased array. Numerical results are compared with an analytical model. EMXT samples...

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Bibliographic Details
Published in:IEEE microwave and wireless components letters Vol. 14; no. 9; pp. 437 - 439
Main Authors: Hao Xin, Kim, M., Hacker, J.B., Higgins, J.A.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-09-2004
Institute of Electrical and Electronics Engineers
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Summary:Electromagnetic crystal (EMXT) surfaces are modeled with effective surface impedance method. Effects of oblique incidence are studied using a technique similar to the waveguide simulator method for analyzing infinite phased array. Numerical results are compared with an analytical model. EMXT samples are characterized by open-ended waveguide reflection measurements using different aperture sizes (WR28 and WR22). The measurements confirm the angular dependence of the EMXT surface impedance. A rectangular waveguide with EMXT sidewalls is modeled by using the angle-dependent effective surface impedance as the sidewall boundary condition. Excellent agreement between this model and full-wave finite-element simulation of the entire waveguide structure is obtained.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:1531-1309
1558-1764
DOI:10.1109/LMWC.2004.832077