The morphology of tin cluster assembled films and the effect of nitrogen

. Thin films produced by depositing tin clusters with sizes between 5 and 10 nm onto silicon nitride substrates were found to be highly coalesced resulting in grains with sizes ~30 nm. Exposing the clusters to nitrogen before they were deposited significantly reduced the coalescence between them and...

Full description

Saved in:
Bibliographic Details
Published in:The European physical journal. D, Atomic, molecular, and optical physics Vol. 61; no. 1; pp. 81 - 85
Main Authors: Watson, T. F., Belić, D., Convers, P. Y., Boyd, E. J., Brown, S. A.
Format: Journal Article
Language:English
Published: Berlin/Heidelberg Springer-Verlag 2011
EDP Sciences
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:. Thin films produced by depositing tin clusters with sizes between 5 and 10 nm onto silicon nitride substrates were found to be highly coalesced resulting in grains with sizes ~30 nm. Exposing the clusters to nitrogen before they were deposited significantly reduced the coalescence between them and resulted in granular films where the clusters mostly retained their shape. This is due to a small amount of tin nitride forming in the clusters. The coalesced and granular films were used to fabricate tin oxide gas sensors. This was done by depositing the two types of films onto silicon nitride chips and then oxidising them by baking at 250 °C for 24 h. It was found that the sensors composed of uncoalesced clusters were much more sensitive to hydrogen. This was attributed to the smaller grain size and the larger surface area of the granular films.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1434-6060
1434-6079
DOI:10.1140/epjd/e2010-00264-7