Inductive Superconducting Fault Current Limiters With Y123 Thin-Film Washers Versus Bi2223 Bulk Rings as Secondaries
We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi 1.8 Pb 0.26 Sr 2 Ca 2 Cu 3 O 10+x rings or Y 1 Ba 2 Cu 3 O 7-delta thin-film washers as secondaries. We have measured the impedance offered by the limiter under current faul...
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Published in: | IEEE transactions on applied superconductivity Vol. 16; no. 3; pp. 1937 - 1942 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
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New York, NY
IEEE
01-09-2006
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi 1.8 Pb 0.26 Sr 2 Ca 2 Cu 3 O 10+x rings or Y 1 Ba 2 Cu 3 O 7-delta thin-film washers as secondaries. We have measured the impedance offered by the limiter under current faults and the recovery time once the faults are cleared. Our results show that the use of thin films can improve the impedance response of these devices and especially their recovery time, which can be about two orders of magnitude shorter than that of bulk samples |
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AbstractList | We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi sub(1.8 )Pb sub(0.26)Sr sub(2) Ca sub(2)Cu sub(3)O sub(10+x) rings or Y sub(1)Ba sub(2)Cu sub(3) O sub(7-delta) thin-film washers as secondaries. We have measured the impedance offered by the limiter under current faults and the recovery time once the faults are cleared. Our results show that the use of thin films can improve the impedance response of these devices and especially their recovery time, which can be about two orders of magnitude shorter than that of bulk samples We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi 1.8 Pb 0.26 Sr 2 Ca 2 Cu 3 O 10+x rings or Y 1 Ba 2 Cu 3 O 7-delta thin-film washers as secondaries. We have measured the impedance offered by the limiter under current faults and the recovery time once the faults are cleared. Our results show that the use of thin films can improve the impedance response of these devices and especially their recovery time, which can be about two orders of magnitude shorter than that of bulk samples |
Author | Lorenzo, J.A. Veira, J.A. Osorio, M.R. Vidal, F. Ferro, G. Toimil, P. |
Author_xml | – sequence: 1 givenname: M.R. surname: Osorio fullname: Osorio, M.R. organization: Lab. d'Informatique pour la Mecanique et les Sci. de l'Ingenieur, Orsay – sequence: 2 givenname: J.A. surname: Lorenzo fullname: Lorenzo, J.A. – sequence: 3 givenname: P. surname: Toimil fullname: Toimil, P. – sequence: 4 givenname: G. surname: Ferro fullname: Ferro, G. – sequence: 5 givenname: J.A. surname: Veira fullname: Veira, J.A. – sequence: 6 givenname: F. surname: Vidal fullname: Vidal, F. |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18100651$$DView record in Pascal Francis |
BookMark | eNpdkUFr3DAQhUVJoEmae6EXUSg9eauRLVk6Jks3CSwUspuGnoTiHXWVeuWtZBX67yvjQKAXSaP53puBd05OwhCQkPfAFgBMf9lebZYLzphcqLbRkr0hZyCEqrgAcVLeTEClOK_fkvOUnhmDRjXijIx3YZe70f9BuslHjN0w1-EnXdncj3SZY8Qw0rU_-BFjoo9-3NMfwGu63ftQrXx_oI827afe93LkRK89L5Pode5_0ftilahNdIOTt40e0zty6myf8PLlviAPq6_b5W21_nZzt7xaV10t-FjJetdaUZYWDmFXW3C2YcJJ0Spty696UtI6ixJr0QBoxrRUzqHFjjW7J1VfkM-z7zEOvzOm0Rx86rDvbcAhJ6O05NAKLQv58T_yecgxlOWMBg6NBpggNkNdHFKK6Mwx-oONfw0wM4VgphDMFIKZQyiSTy--NnW2d9GGzqdXnYICCyjch5nziPjalqrV0NT_ADqMkGg |
CODEN | ITASE9 |
CitedBy_id | crossref_primary_10_1088_0953_2048_21_9_095013 crossref_primary_10_1016_j_jpcs_2010_03_015 crossref_primary_10_1088_0953_2048_20_5_009 crossref_primary_10_1088_1742_6596_97_1_012034 crossref_primary_10_1590_S1516_14392014005000079 crossref_primary_10_1088_0953_2048_19_12_009 crossref_primary_10_1088_0143_0807_33_4_757 |
Cites_doi | 10.1088/0953-2048/17/7/008 10.1109/77.614690 10.1088/0953-2048/17/7/018 10.1109/77.783381 10.1109/77.614631 10.1109/77.920257 10.1109/TASC.2002.1018542 10.1016/S0921-4534(02)01000-6 10.1109/77.920371 10.1016/S0921-4526(99)02956-7 10.1109/TASC.2004.839778 10.1016/S0921-4534(02)01100-0 10.1109/77.402736 10.1103/PhysRevB.68.054514 10.1109/77.783384 10.1109/77.783487 10.1063/1.1632543 10.1088/0953-2048/18/5/028 10.1109/TASC.2002.801816 |
ContentType | Journal Article |
Copyright | 2007 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006 |
Copyright_xml | – notice: 2007 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006 |
DBID | 97E RIA RIE IQODW AAYXX CITATION 7SP 7U5 8FD L7M F28 FR3 H8G JG9 |
DOI | 10.1109/TASC.2006.874960 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library Online Pascal-Francis CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database Copper Technical Reference Library Materials Research Database |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Materials Research Database Copper Technical Reference Library Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Materials Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics Applied Sciences |
EISSN | 1558-2515 |
EndPage | 1942 |
ExternalDocumentID | 2544260621 10_1109_TASC_2006_874960 18100651 1687914 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ DU5 EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PZZ RIA RIE RIG RNS TN5 VH1 XFK ABPTK IQODW AAYXX CITATION 7SP 7U5 8FD L7M F28 FR3 H8G JG9 |
ID | FETCH-LOGICAL-c352t-63d7a58225fe1d3a1fa405f65789a2258b86afae6e35411900968ffeaec04db83 |
IEDL.DBID | RIE |
ISSN | 1051-8223 |
IngestDate | Fri Aug 16 08:45:12 EDT 2024 Thu Oct 10 20:00:46 EDT 2024 Fri Aug 23 02:34:29 EDT 2024 Sun Oct 22 16:03:45 EDT 2023 Wed Jun 26 19:28:34 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 3 |
Keywords | Thermal characteristic Performance evaluation Waveform Superconducting thin films Bismuth compound Inductive circuit Superconductor device Electric impedance measurement Recovery time Fault current limiters Experimental result Yttrium compound Current time characteristic Fault current limiter Comparative study |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c352t-63d7a58225fe1d3a1fa405f65789a2258b86afae6e35411900968ffeaec04db83 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 912149116 |
PQPubID | 85434 |
PageCount | 6 |
ParticipantIDs | ieee_primary_1687914 proquest_journals_912149116 pascalfrancis_primary_18100651 proquest_miscellaneous_896217596 crossref_primary_10_1109_TASC_2006_874960 |
PublicationCentury | 2000 |
PublicationDate | 2006-09-01 |
PublicationDateYYYYMMDD | 2006-09-01 |
PublicationDate_xml | – month: 09 year: 2006 text: 2006-09-01 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY – name: New York |
PublicationTitle | IEEE transactions on applied superconductivity |
PublicationTitleAbbrev | TASC |
PublicationYear | 2006 |
Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref20 ref11 ref10 ref2 ref1 ref16 ref19 ref18 ref8 ref7 ref9 ref4 ref3 ref6 ref5 via (ref17) 2003; 68 |
References_xml | – ident: ref12 doi: 10.1088/0953-2048/17/7/008 – ident: ref9 doi: 10.1109/77.614690 – ident: ref15 doi: 10.1088/0953-2048/17/7/018 – ident: ref2 doi: 10.1109/77.783381 – ident: ref1 doi: 10.1109/77.614631 – ident: ref4 doi: 10.1109/77.920257 – ident: ref20 doi: 10.1109/TASC.2002.1018542 – volume: 68 start-page: 224506-1/-10 year: 2003 ident: ref17 article-title: self-heating effects on the transition to a highly dissipative state at high current density in superconducting thin films publication-title: Phys Rev B contributor: fullname: via – ident: ref19 doi: 10.1016/S0921-4534(02)01000-6 – ident: ref11 doi: 10.1109/77.920371 – ident: ref18 doi: 10.1016/S0921-4526(99)02956-7 – ident: ref5 doi: 10.1109/TASC.2004.839778 – ident: ref6 doi: 10.1016/S0921-4534(02)01100-0 – ident: ref8 doi: 10.1109/77.402736 – ident: ref13 doi: 10.1103/PhysRevB.68.054514 – ident: ref10 doi: 10.1109/77.783384 – ident: ref3 doi: 10.1109/77.783487 – ident: ref14 doi: 10.1063/1.1632543 – ident: ref16 doi: 10.1088/0953-2048/18/5/028 – ident: ref7 doi: 10.1109/TASC.2002.801816 |
SSID | ssj0014845 |
Score | 1.8329661 |
Snippet | We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi 1.8 Pb 0.26 Sr 2 Ca 2 Cu 3 O... We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi sub(1.8 )Pb sub(0.26)Sr sub(2)... |
SourceID | proquest crossref pascalfrancis ieee |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 1937 |
SubjectTerms | Applied sciences COPPER OXIDE Current limiters Devices ELECTRONIC PRODUCTS Electronics Exact sciences and technology Fault current limiter Fault current limiters Faults High temperature superconductors IMPEDANCE Recovery time Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Substrates Superconducting devices Superconducting films Superconducting thin films SUPERCONDUCTIVITY SUPERCONDUCTORS Thin film devices THIN FILMS Transistors Washers Welding |
Title | Inductive Superconducting Fault Current Limiters With Y123 Thin-Film Washers Versus Bi2223 Bulk Rings as Secondaries |
URI | https://ieeexplore.ieee.org/document/1687914 https://www.proquest.com/docview/912149116 https://search.proquest.com/docview/896217596 |
Volume | 16 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwEB7RSkhwANqCCKWVD1yQCI3XjmMf-1r11ANbBJyiie3Aqku22iT_H4-9DxBcuCVxpEQzfsw3rw_gnZ1IV4mJCNjEBoBiRZGjdG0utBWea-1sRfXON7Pq9qu-uqY2OR-2tTDe-5h85j_SZYzlu6UdyVV2xpWuDLFW71VGp1qtbcRA6khIHMwFnodDT2xCkoU5uzufXaawg66kic0od0dQ5FShjEjsg1DaxGbx18YcT5vp8__7zxfwbG1VsvM0DQ7gke8O4elvvQYP4XHM9bT9EQxE1xG3OTYbH_wqIOJ4331nUxwXA1v3bGKp-GnVsy_z4Qf7Fk4fRjSf-XS--MmIhYnGyOE29uxiTiYAuxgX9-wTed8Z9mxGaNtFNP4SPk-v7y5v8jX5Qm6DTTbkSrgKyyDJsvXcCeQtBtuuVWGFGwxPdaMVtuiVF6XkwawIWEi3rUdvC-kaLV7Bfrfs_GtgaDy18WsUTlAGCNpIxLKQlXJFo1E1Gbzf6KN-SD026ohNClOT7ogqU9VJdxkckbx37yVRZ3D6hwJ345qTlcUzON5otF6v0r42fBIAIucqA7YdDcuLYibY-eXY19qoANpKo978-8PH8CQ5ZSjr7C3sD6vRn8Be78bTOD9_AbzH4lc |
link.rule.ids | 315,782,786,798,27933,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwEB5BEQIOPNoiQqH4wAWJ0HjtOPaxLV0tovTALgJOkRM7sGLJVpvk_zNj7wMEF25JHCnRjB_zzesDeFmPpCvESCA2qRGg1CJLrXRNKnQtPNfa1QXVO0-mxdUX_faC2uS83tbCeO9D8pl_Q5chlu-W9UCushOudGGItfpWLgtVxGqtbcxA6kBJjAYDT_HYE5ugZGZOZqfT8xh40IU0oR3l7hAKrCqUE2k7FEsT-Sz-2prDeTN-8H9_-hDur-1KdhonwiO44dt9uPdbt8F9uB2yPevuAHoi7AgbHZsO136FmDjct9_Y2A6Lnq27NrFY_rTq2Od5_519xfOHEdFnOp4vfjLiYaIxcrkNHTubkxHAzobFD_aR_O_MdmxKeNsFPH4In8YXs_NJuqZfSGu0yvpUCVfYHCWZN547YXlj0bprFK5xY_GprrSyjfXKi1xyNCwQDemm8dbXmXSVFo9hr122_gkwazw18quUHVmJILSS1uYZ6tBllbaqSuDVRh_ldeyyUQZ0kpmSdEdkmaqMukvggOS9ey-KOoHjPxS4G9ec7CyewNFGo-V6nXal4SOEiJyrBNh2FBcYRU1s65dDV2qjELblRj3994dfwJ3J7MNlefnu6v0R3I0uGspBewZ7_Wrwz-Fm54bjMFd_Acld5ag |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Inductive+Superconducting+Fault+Current+Limiters+With+Y123+Thin-Film+Washers+Versus+Bi2223+Bulk+Rings+as+Secondaries&rft.jtitle=IEEE+transactions+on+applied+superconductivity&rft.au=Osorio%2C+M.R.&rft.au=Lorenzo%2C+J.A.&rft.au=Toimil%2C+P.&rft.au=Ferro%2C+G.&rft.date=2006-09-01&rft.pub=IEEE&rft.issn=1051-8223&rft.eissn=1558-2515&rft.volume=16&rft.issue=3&rft.spage=1937&rft.epage=1942&rft_id=info:doi/10.1109%2FTASC.2006.874960&rft.externalDocID=1687914 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-8223&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-8223&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-8223&client=summon |