Inductive Superconducting Fault Current Limiters With Y123 Thin-Film Washers Versus Bi2223 Bulk Rings as Secondaries

• Published in: IEEE transactions on applied superconductivity Vol. 16; no. 3; pp. 1937 - 1942
• Main Authors: Osorio, M.R., Lorenzo, J.A., Toimil, P., Ferro, G., Veira, J.A., Vidal, F.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-09-2006; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; COPPER OXIDE; Current limiters; Devices; ELECTRONIC PRODUCTS; Electronics; Exact sciences and technology; Fault current limiter; Fault current limiters; Faults; High temperature superconductors; IMPEDANCE; Recovery time; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Substrates; Superconducting devices; Superconducting films; Superconducting thin films; SUPERCONDUCTIVITY; SUPERCONDUCTORS; Thin film devices; THIN FILMS; Transistors; Washers; Welding; Thermal characteristic; Performance evaluation; Waveform; Superconducting thin films; Bismuth compound; Inductive circuit; Superconductor device; Electric impedance measurement; Recovery time; Fault current limiters; Experimental result; Yttrium compound; Current time characteristic; Fault current limiter; Comparative study
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2006.874960

We present the comparison between the performance of an inductive superconducting fault current limiter operating with bulk Bi 1.8 Pb 0.26 Sr 2 Ca 2 Cu 3 O 10+x rings or Y 1 Ba 2 Cu 3 O 7-delta thin-film washers as secondaries. We have measured the impedance offered by the limiter under current faults and the recovery time once the faults are cleared. Our results show that the use of thin films can improve the impedance response of these devices and especially their recovery time, which can be about two orders of magnitude shorter than that of bulk samples