Robustness evaluation using highly accelerated life testing

This paper presents experimental aspects and results of highly accelerated life testing in order to study the robustness of electronic boards subject to two main covariates: thermal and vibration stresses. Statistical analysis of test results and assessment of the product quality characteristics und...

Full description

Saved in:
Bibliographic Details
Published in:International journal of advanced manufacturing technology Vol. 56; no. 9-12; pp. 1253 - 1261
Main Authors: Charki, Abdérafi, Laronde, R., Guérin, F., Bigaud, D., Coadou, F.
Format: Journal Article
Language:English
Published: London Springer-Verlag 01-10-2011
Springer Nature B.V
Springer Verlag
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract This paper presents experimental aspects and results of highly accelerated life testing in order to study the robustness of electronic boards subject to two main covariates: thermal and vibration stresses. Statistical analysis of test results and assessment of the product quality characteristics under different conditions (operating and destruction limits) are presented. Recommendations for further testing are also presented.
AbstractList This paper presents experimental aspects and results of highly accelerated life testing in order to study the robustness of electronic boards subject to two main covariates: thermal and vibration stresses. Statistical analysis of test results and assessment of the product quality characteristics under different conditions (operating and destruction limits) are presented. Recommendations for further testing are also presented.
Author Charki, Abdérafi
Guérin, F.
Coadou, F.
Bigaud, D.
Laronde, R.
Author_xml – sequence: 1
  givenname: Abdérafi
  surname: Charki
  fullname: Charki, Abdérafi
  email: abderafi.charki@univ-angers.fr
  organization: LASQUO, ISTIA–University of Angers
– sequence: 2
  givenname: R.
  surname: Laronde
  fullname: Laronde, R.
  organization: LASQUO, ISTIA–University of Angers
– sequence: 3
  givenname: F.
  surname: Guérin
  fullname: Guérin, F.
  organization: LASQUO, ISTIA–University of Angers
– sequence: 4
  givenname: D.
  surname: Bigaud
  fullname: Bigaud, D.
  organization: LASQUO, ISTIA–University of Angers
– sequence: 5
  givenname: F.
  surname: Coadou
  fullname: Coadou, F.
  organization: LASQUO, ISTIA–University of Angers
BackLink https://univ-angers.hal.science/hal-03428233$$DView record in HAL
BookMark eNp1kE9Lw0AQxRepYFv9AN4Cnjyszu40mxRPpfgPCoLoedlsZtuUmNTdpFA_vVsievI08Ob3Ho83YaOmbYixSwE3AiC7DQAiAw5CcJRqxr9O2FjMEDmCSEdsDFLlHDOVn7FJCNtIK6HyMbt7bYs-dA2FkNDe1L3pqrZJ-lA162RTrTf1ITHWUk3edFQmdeUo6Sh08X_OTp2pA1383Cl7f7h_Wz7x1cvj83Kx4hZT6HihSuuEAbBYFBQlMAqcsXMQ4HIoM5AlKhCYu8za1JaSyBZlDqQKZ1PCKbsecjem1jtffRh_0K2p9NNipY8a4EzmEnEvIns1sDvffvaxp962vW9iPS2lkjjHNEsjJQbK-jYET-43VoA-7qmHPXXcUx_31F_RIwdPiGyzJv-X_L_pG6GmekM
CitedBy_id crossref_primary_10_1007_s00170_021_07627_w
crossref_primary_10_1016_j_microrel_2015_07_025
crossref_primary_10_1080_02286203_2017_1297923
crossref_primary_10_1109_TEMC_2023_3244061
crossref_primary_10_3390_polym13162764
crossref_primary_10_1007_s13726_020_00836_2
crossref_primary_10_1016_j_matdes_2014_10_016
crossref_primary_10_1016_j_microrel_2020_113702
crossref_primary_10_1007_s00170_012_4303_0
Cites_doi 10.1002/(SICI)1099-1638(199811/12)14:6<385::AID-QRE217>3.0.CO;2-E
10.1002/9780470316795
10.1051/ijmqe/2010012
ContentType Journal Article
Copyright Springer-Verlag London Limited 2011
The International Journal of Advanced Manufacturing Technology is a copyright of Springer, (2011). All Rights Reserved.
Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml – notice: Springer-Verlag London Limited 2011
– notice: The International Journal of Advanced Manufacturing Technology is a copyright of Springer, (2011). All Rights Reserved.
– notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID AAYXX
CITATION
8FE
8FG
ABJCF
AFKRA
BENPR
BGLVJ
CCPQU
DWQXO
HCIFZ
L6V
M7S
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
1XC
DOI 10.1007/s00170-011-3264-z
DatabaseName CrossRef
ProQuest SciTech Collection
ProQuest Technology Collection
Materials Science & Engineering Collection
ProQuest Central
ProQuest Central
Technology Collection
ProQuest One Community College
ProQuest Central
SciTech Premium Collection (Proquest) (PQ_SDU_P3)
ProQuest Engineering Collection
Engineering Database
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
Engineering Collection
Hyper Article en Ligne (HAL)
DatabaseTitle CrossRef
Engineering Database
Technology Collection
ProQuest One Academic Eastern Edition
SciTech Premium Collection
ProQuest One Community College
ProQuest Technology Collection
ProQuest SciTech Collection
ProQuest Central China
ProQuest Central
ProQuest Engineering Collection
ProQuest One Academic UKI Edition
ProQuest Central Korea
Materials Science & Engineering Collection
ProQuest One Academic
Engineering Collection
DatabaseTitleList

Engineering Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1433-3015
EndPage 1261
ExternalDocumentID oai_HAL_hal_03428233v1
10_1007_s00170_011_3264_z
GroupedDBID -5B
-5G
-BR
-EM
-XW
-XX
-Y2
-~C
.86
.VR
06D
0R~
0VY
123
1N0
1SB
203
28-
29J
29~
2J2
2JN
2JY
2KG
2KM
2LR
2P1
2VQ
2~H
30V
4.4
406
408
409
40D
40E
5GY
5QI
5VS
67Z
6NX
8FE
8FG
8TC
8UJ
95-
95.
95~
96X
9M8
AAAVM
AABHQ
AABYN
AAFGU
AAHNG
AAIAL
AAJKR
AANZL
AARHV
AARTL
AATNV
AATVU
AAUYE
AAWCG
AAYFA
AAYIU
AAYQN
AAYTO
ABBBX
ABBXA
ABDBF
ABDEX
ABDZT
ABECU
ABFGW
ABFTD
ABFTV
ABHQN
ABJCF
ABJNI
ABJOX
ABKAG
ABKAS
ABKCH
ABKTR
ABMNI
ABMQK
ABNWP
ABPTK
ABQBU
ABSXP
ABTAH
ABTEG
ABTHY
ABTKH
ABTMW
ABULA
ABWNU
ABXPI
ACBMV
ACBRV
ACBXY
ACBYP
ACGFS
ACHSB
ACHXU
ACIGE
ACIPQ
ACIWK
ACKNC
ACMDZ
ACMLO
ACOKC
ACOMO
ACTTH
ACVWB
ACWMK
ADHHG
ADHIR
ADINQ
ADKNI
ADKPE
ADMDM
ADMVV
ADOXG
ADQRH
ADRFC
ADTPH
ADURQ
ADYFF
ADZKW
AEBTG
AEEQQ
AEFIE
AEFTE
AEGAL
AEGNC
AEJHL
AEJRE
AEKMD
AEKVL
AENEX
AEOHA
AEPYU
AESKC
AESTI
AETLH
AEVLU
AEVTX
AEXYK
AFEXP
AFGCZ
AFKRA
AFLOW
AFNRJ
AFQWF
AFWTZ
AFZKB
AGAYW
AGDGC
AGGBP
AGGDS
AGJBK
AGMZJ
AGQMX
AGWIL
AGWZB
AGYKE
AHAVH
AHBYD
AHSBF
AHYZX
AIAKS
AIIXL
AILAN
AIMYW
AITGF
AJBLW
AJDOV
AJRNO
AJZVZ
AKQUC
ALMA_UNASSIGNED_HOLDINGS
ALWAN
AMKLP
AMXSW
AMYLF
AMYQR
AOCGG
ARCEE
ARMRJ
ASPBG
AVWKF
AXYYD
AYJHY
AZFZN
B-.
B0M
BA0
BBWZM
BDATZ
BENPR
BGLVJ
BGNMA
CAG
CCPQU
COF
CS3
CSCUP
DDRTE
DL5
DNIVK
DPUIP
DU5
EAD
EAP
EAS
EBLON
EBS
EIOEI
EJD
EMK
EPL
ESBYG
ESX
FEDTE
FERAY
FFXSO
FIGPU
FINBP
FNLPD
FRRFC
FSGXE
FWDCC
GGCAI
GGRSB
GJIRD
GNWQR
GQ6
GQ7
GQ8
GXS
HCIFZ
HF~
HG5
HG6
HMJXF
HQYDN
HRMNR
HVGLF
HZ~
I-F
I09
IHE
IJ-
IKXTQ
ITM
IWAJR
IXC
IZIGR
IZQ
I~X
I~Z
J-C
J0Z
JBSCW
JCJTX
JZLTJ
KDC
KOV
KOW
L6V
LAS
LLZTM
M4Y
M7S
MA-
ML~
N2Q
N9A
NB0
NDZJH
NPVJJ
NQJWS
NU0
O9-
O93
O9G
O9I
O9J
OAM
P19
P9P
PF0
PT4
PT5
PTHSS
QOK
QOS
R4E
R89
R9I
RHV
RIG
RNI
RNS
ROL
RPX
RSV
RZK
S16
S1Z
S26
S27
S28
S3B
SAP
SCLPG
SCV
SDH
SDM
SEG
SHX
SISQX
SJYHP
SNE
SNPRN
SNX
SOHCF
SOJ
SPISZ
SRMVM
SSLCW
STPWE
SZN
T13
T16
TN5
TSG
TSK
TSV
TUC
TUS
U2A
UG4
UNUBA
UOJIU
UTJUX
UZXMN
VC2
VFIZW
W23
W48
WK8
YLTOR
Z45
Z5O
Z7R
Z7S
Z7V
Z7W
Z7X
Z7Y
Z7Z
Z81
Z83
Z85
Z86
Z88
Z8M
Z8N
Z8P
Z8Q
Z8R
Z8S
Z8T
Z8U
Z8V
Z8W
Z8Z
Z92
ZMTXR
ZY4
_50
~8M
~A9
~EX
AACDK
AAEOY
AAJBT
AASML
AAYXX
ABAKF
ACAOD
ACDTI
ACZOJ
AEFQL
AEMSY
AFBBN
AGQEE
AGRTI
AIGIU
CITATION
H13
DWQXO
PQEST
PQQKQ
PQUKI
PRINS
1XC
AAYZH
ID FETCH-LOGICAL-c350t-b6dcf1a00c3bbe3500a60fac9010f80d702d360138f7cc5cd2eecbd80e6bfc5e3
IEDL.DBID AEJHL
ISSN 0268-3768
IngestDate Tue Oct 15 15:15:27 EDT 2024
Thu Oct 10 19:45:02 EDT 2024
Thu Sep 12 16:51:05 EDT 2024
Sat Dec 16 12:04:41 EST 2023
IsPeerReviewed true
IsScholarly true
Issue 9-12
Keywords Accelerated testing
Reliability
Robustness
Computer-Aided Engineering (CAD
Industrial
Mechanical
reliability
CAE) and Design
accelerated
Production/Logistics/Supply
Language English
License Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c350t-b6dcf1a00c3bbe3500a60fac9010f80d702d360138f7cc5cd2eecbd80e6bfc5e3
ORCID 0000-0002-5743-1042
0000-0001-8474-2885
PQID 2262393575
PQPubID 2044010
PageCount 9
ParticipantIDs hal_primary_oai_HAL_hal_03428233v1
proquest_journals_2262393575
crossref_primary_10_1007_s00170_011_3264_z
springer_journals_10_1007_s00170_011_3264_z
PublicationCentury 2000
PublicationDate 2011-10-01
PublicationDateYYYYMMDD 2011-10-01
PublicationDate_xml – month: 10
  year: 2011
  text: 2011-10-01
  day: 01
PublicationDecade 2010
PublicationPlace London
PublicationPlace_xml – name: London
– name: Heidelberg
PublicationTitle International journal of advanced manufacturing technology
PublicationTitleAbbrev Int J Adv Manuf Technol
PublicationYear 2011
Publisher Springer-Verlag
Springer Nature B.V
Springer Verlag
Publisher_xml – name: Springer-Verlag
– name: Springer Nature B.V
– name: Springer Verlag
References Dodson B, Nolan D (1999) Reliability engineering handbook, quality and reliability. New York: Marcel Dekker
IEC 60584–1 (1995) Thermocouples—part 1: reference tables
ISO/IEC 17025 (2005) General requirements for the competence of testing and calibration laboratories
LarondeRCharkiABigaudDReliability of photovoltaic modules based on climatic measurement dataInt J Met Qual Eng20101454910.1051/ijmqe/2010012
NelsonWAccelerated testing: statistical modes, test plans and data analyses1990New YorkWiley Interscience
McLeanHWHALT, HASS and HASA explained: accelerated reliability techniques2000Milwaukee, WIASQ Quality
Guérin F, Lantieri P, Dumon B (2001) Approche théorique des essais aggravés, Astelab
Ringler J (2004) Principes de base et objectifs des essais aggravés, Phoebus n°29, Editions Préventique
NF X 15140 (2002) Mesure de l’humidité de l’air—Enceintes climatiques et thermostatiques—Caractérisation et Vérification, Octobre
PrakashSThe Application of HALT and HASS principles in high volume manufacturing environmentQual Reliab Eng Int19981438539210.1002/(SICI)1099-1638(199811/12)14:6<385::AID-QRE217>3.0.CO;2-E
3264_CR1
S Prakash (3264_CR4) 1998; 14
3264_CR7
HW McLean (3264_CR3) 2000
3264_CR8
3264_CR5
3264_CR6
3264_CR9
R Laronde (3264_CR10) 2010; 1
W Nelson (3264_CR2) 1990
References_xml – ident: 3264_CR1
– ident: 3264_CR9
– volume: 14
  start-page: 385
  year: 1998
  ident: 3264_CR4
  publication-title: Qual Reliab Eng Int
  doi: 10.1002/(SICI)1099-1638(199811/12)14:6<385::AID-QRE217>3.0.CO;2-E
  contributor:
    fullname: S Prakash
– ident: 3264_CR5
– ident: 3264_CR8
– ident: 3264_CR7
– ident: 3264_CR6
– volume-title: Accelerated testing: statistical modes, test plans and data analyses
  year: 1990
  ident: 3264_CR2
  doi: 10.1002/9780470316795
  contributor:
    fullname: W Nelson
– volume-title: HALT, HASS and HASA explained: accelerated reliability techniques
  year: 2000
  ident: 3264_CR3
  contributor:
    fullname: HW McLean
– volume: 1
  start-page: 45
  year: 2010
  ident: 3264_CR10
  publication-title: Int J Met Qual Eng
  doi: 10.1051/ijmqe/2010012
  contributor:
    fullname: R Laronde
SSID ssj0016168
ssib034539549
ssib019759004
ssib029851711
Score 2.081404
Snippet This paper presents experimental aspects and results of highly accelerated life testing in order to study the robustness of electronic boards subject to two...
SourceID hal
proquest
crossref
springer
SourceType Open Access Repository
Aggregation Database
Publisher
StartPage 1253
SubjectTerms Appliance industry
CAE) and Design
Computer-Aided Engineering (CAD
Engineering
Engineering Sciences
Highly accelerated lifetime testing
Industrial and Production Engineering
Mechanical Engineering
Media Management
Original Article
Robustness
Statistical analysis
Vibration analysis
Title Robustness evaluation using highly accelerated life testing
URI https://link.springer.com/article/10.1007/s00170-011-3264-z
https://www.proquest.com/docview/2262393575
https://univ-angers.hal.science/hal-03428233
Volume 56
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8NAEB5se9GDb7G-COJJWdk8NtngqWhrFfGgFbyF7KuKJRXbCvrr3UmTVEUPegpsFpbMzs5M5pv9BuDAo9qLrd8ggWKKWIPHCOehIYEIAh0ww1SKqYHubXR9z8_aSJPjVamL7Om4RCRzQ13ddcuZXghm9GzEEZD3GjSs62GsDo1W-7J7VWqRG0fYCbPSMi_G9vMzLfYD5k-xrQJrCN38wpz9GeF43HiJff606BfvVXvA2slPgek3LDV3UZ2l_3zcMiwWAanTmmrQCszpbBUWPtEUrsHJzVBMRmM0is6MHdzBkvm-g3zHgzcnldI6MOSdUM7g0WhnjPQdWX8d7jrt3mmXFE0XiPQZHRMRKmnclFLpC6HtEE1DalKJZRyGUxVRT_kh4psmkpJJ5WktheJUh8JIpv0NqGfDTG-CQ5nmXMQiDLW2pgH3wVBhYm4jehWlvAmHpTCT5ym3RlKxKOcSSaxEEpRI8t6EfSvuah6yYndbVwmOIYsh93z_1W3CTrkbSXEWR4kNMHOet4g14agU_-z1rytu_Wn2Nsx7ZXmguwP18ctE70JtpCZ7hYLi86J33vkAyP_bLg
link.rule.ids 230,315,782,786,887,27935,27936,41075,42144,48346,48349,48359,49651,49654,49664,52155
linkProvider Springer Nature
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnZ1LSwMxEIAHWw_qwbdYn4t4UgLZzWY3i6fig4rVgw_QU9i8qiBVbCvorzez3W1V9KDXbCBkMpmZzUy-AOxG1EaZ9xskNtwQb_A4ESJxJFZxbGPuuMnxaKB1lV7ciqNjxOSw6i5MUe1epSQLSz267FagXgge6fmQIybvNZhE2Hlch8nm7d3dUaVGYZbiU5gjNYsyfH9-rMYs5myY3CqTDUlY3JjzfyMC95uokp8_DfrFfdXusXjyU2T6LZla-KiTuX_Nbh5my5A0aA51aAEmbHcRZj6BCpfg4PJJDXp9NIvBmA8eYNF8J0Di8eNbkGvtXRiSJ0zw-OBs0EeAR7ezDDcnx9eHLVI-u0A047RPVGK0C3NKNVPK-iaaJ9TlGgs5nKAmpZFhCWY4Xao11yayVisjqE2U09yyFah3n7p2FQLKrRAqU0lirTcOuBCOKpcJH9ObNBcN2KukKZ-HdA054igXEpFeIhIlIt8bsOPlPeqHXOxWsy2xDTmGImLsNWzARrUcstyNPelDzIL0lvIG7FfiH3_-dcS1P_XehqnW9Xlbtk8vztZhOqqKBcMNqPdfBnYTaj0z2Cq19QNrat3S
linkToPdf http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpZ1LS8QwEIAHV0H04Ftcn0U8KcH0kTbFgyzquqKI-ABvoXmpIFXcrqC_3ky33VXRg3hNAyGTSWaamfkCsBVQE6TObpBIM03cgccI57ElkYwiEzHLdIZXA52r5PyWHx4hJme_roUps93rkGS_pgEpTXmx-6zt7qDwrcS-ELzec-5HRN4bMIa3Yk7Fx1on18ftWqX8NMFnMQcqF6T4Fv1QpcOIhf1AVxV4iP2yes79mXDce7wOhP406BdT1rjHRMpPXuq3wGppr9rT_57pDExVrqrX6uvWLIyYfA4mPwEM52Hv8kn2ugUel96QG-5hMv2dhyTkxzcvU8qZNiRSaO_xwRqvQLBHfrcAN-2j64MOqZ5jICpktCAy1sr6GaUqlNK4JprF1GYKEzwspzqhgQ5jjHzaRCmmdGCMkppTE0urmAkXYTR_ys0SeJQZzmUq49gYd2jgolgqbcqdr6-TjDdhu5aseO5TN8SAr1xKRDiJCJSIeG_CppP9oB_ysjutM4FtyDfkQRi--k1YrZdGVLu0K5zrWRLgEtaEnXophp9_HXH5T703YPzisC3OTs5PV2AiqHMI_VUYLV56Zg0aXd1brxT3Az6d5mk
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Robustness+evaluation+using+highly+accelerated+life+testing&rft.jtitle=International+journal+of+advanced+manufacturing+technology&rft.au=Charki%2C+Abd%C3%A9rafi&rft.au=Laronde%2C+R.&rft.au=Gu%C3%A9rin%2C+F.&rft.au=Bigaud%2C+D.&rft.date=2011-10-01&rft.pub=Springer-Verlag&rft.issn=0268-3768&rft.eissn=1433-3015&rft.volume=56&rft.issue=9-12&rft.spage=1253&rft.epage=1261&rft_id=info:doi/10.1007%2Fs00170-011-3264-z&rft.externalDocID=10_1007_s00170_011_3264_z
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0268-3768&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0268-3768&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0268-3768&client=summon