Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling

The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of phot...

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Bibliographic Details
Published in:Applied physics letters Vol. 55; no. 11; pp. 1088 - 1090
Main Authors: AHRENKIEL, R. K, DUNLAVY, D. J, KEYES, B, VERNON, S. M, DIXON, T. M, TOBIN, S. P, MILLER, K. L, HAYES, R. E
Format: Journal Article
Language:English
Published: Melville, NY American Institute of Physics 11-09-1989
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Summary:The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation.
Bibliography:None
ISSN:0003-6951
1077-3118
DOI:10.1063/1.101713