Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling
The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of phot...
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Published in: | Applied physics letters Vol. 55; no. 11; pp. 1088 - 1090 |
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Main Authors: | , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Melville, NY
American Institute of Physics
11-09-1989
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Subjects: | |
Online Access: | Get full text |
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Summary: | The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation. |
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Bibliography: | None |
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.101713 |