Paternity testing using massively parallel sequencing and the PowerSeq™ AUTO/Y system for short tandem repeat sequencing

Massively parallel sequencing (MPS) is gaining attention as a new technology for routine forensic casework, including paternity testing. Recently released MPS multiplex panels provide many more loci compared to CE methods, plus provide sequence‐based alleles that together improve the statistical pow...

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Bibliographic Details
Published in:Electrophoresis Vol. 39; no. 21; pp. 2669 - 2673
Main Authors: S. B. S. Silva, Deborah, Sawitzki, Fernanda R., Scheible, Melissa K. R., Bailey, Sarah F., S. Alho, Clarice, Faith, Seth A.
Format: Journal Article
Language:English
Published: Weinheim Wiley Subscription Services, Inc 01-11-2018
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Summary:Massively parallel sequencing (MPS) is gaining attention as a new technology for routine forensic casework, including paternity testing. Recently released MPS multiplex panels provide many more loci compared to CE methods, plus provide sequence‐based alleles that together improve the statistical power of the genetic testing. Here, an MPS system (PowerSeq™ AUTO/Y) was applied for STR sequencing in the study of first‐degree STR sequence allele inheritance from families in Southern Brazil. In 29 trios (mother‐child‐father) analyzed, the paternity index values generally increased when data from sequence‐based analysis were used in comparison to length‐based data. Further, allele inconsistencies (e.g., single repeat mutation events) between child and parents could be resolved with MPS by assessing the core repeat and flanking region sequences. Lastly, the sequence information allowed for identification of isoalleles (alleles of the same size, but different sequence) to determine specific paternal and maternal inheritances. The results from this study showed advantages of implementing sequence‐based analysis, MPS, in paternity testing with improved statistical calculations and a greater resolution for the trios/families tested.
Bibliography:Current Address: Battelle Memorial Institute, 505 King Avenue, Columbus, OH 43201, USA
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ISSN:0173-0835
1522-2683
DOI:10.1002/elps.201800072