Light Beam Transformation and Material Diagnostics by Dynamic Holography Methods

• Published in: Journal of applied spectroscopy Vol. 90; no. 2; pp. 407 - 413
• Main Authors: Tolstik, A. L., Ivakin, E. V., Dadenkov, I. G.
• Format: Journal Article
• Language: English
• Published: New York Springer US 01-05-2023; Springer; Springer Nature B.V
• Subjects: Analysis; Analytical Chemistry; Anisotropy; Atomic/Molecular Structure and Spectra; Bismuth silicate; Crystal lattices; Dielectric films; Diffusion coefficient; Holography; Infrared imagery; Intermetallic compounds; Lead tellurides; Light beams; Methods; Photorefractivity; Physics; Physics and Astronomy; Semiconductor materials; Semiconductors; Silicon compounds; Thermal diffusivity; Thermal properties; Thin films; thermoelectric; semiconductor; bismuth silicate; spatially modulated spectroscopy; multi-wave mixing; activated crystal; dynamic holography
• ISSN: 0021-9037; 1573-8647
• DOI: 10.1007/s10812-023-01547-1

Experimental results on frequency conversion of images by dynamic holograms and diagnostics of semiconductor materials and photorefractive and activated crystals based on the transient gratings method are presented. The possibility of visualization of infrared 3D images in real time is shown. Spectral regularities of short- (hundreds of microseconds) and long-lived (seconds) lattice recordings in photorefractive bismuth silicate crystals are established. The diffusion coefficient of excitation energy and the lifetime of excited states are measured. Techniques for compensation of induced anisotropy in active laser media and measurement of the thermal diffusivity coefficient of thin films and bulk thermoelectrics based on lead telluride are proposed.