Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry

A new atom probe design is presented along with data showing spectral performance and selected microstructural characterization examples. The instrument includes a curved reflectron, a 532-nm laser, and an integrated, fixed-position, counter electrode in a configuration with moderate electric field...

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Bibliographic Details
Published in:	JOM (1989) Vol. 70; no. 9; pp. 1776 - 1784
Main Authors:	Larson, David J., Ulfig, Robert M., Lenz, Dan R., Bunton, Joseph H., Shepard, Jeff D., Payne, Timothy R., Rice, Katherine P., Chen, Yimeng, Prosa, Ty J., Rauls, Dan J., Kelly, Thomas F., Sridharan, Niyanth, Babu, Suresh
Format:	Journal Article
Language:	English
Published:	New York Springer US 01-09-2018 Springer Nature B.V Springer
Subjects:	3D Nanoscale Characterization of Metals Aluminum Aperture atom probe tomography Austenitic stainless steels Chemistry/Food Science counter electrode Earth Sciences Electric fields Electrodes Electron backscatter diffraction Electron beams Electrons electropolishing Engineering Environment FIB focused ion beam Geometry Grain boundaries Laser beams Lasers local electrode Materials MATERIALS SCIENCE Microstructure Minerals nanoscale Nickel base alloys Physics Silicon steels Software Superalloys Tomography transmission electron backscatter diffraction United States > US Ohio
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