Removal of impurities from zirconium tetrafluoride using metallic zirconium chips

The sublimation refining of zirconium tetrafluoride (ZTF) from impurities in the presence of metallic zirconium chips is studied. It is shown that, in the presence of metallic zirconium chips, the contents of aluminum, nickel, oxygen, chromium, iron, and silicon impurities in a desublimate decrease...

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Bibliographic Details
Published in:	Russian metallurgy Metally Vol. 2016; no. 11; pp. 1078 - 1082
Main Authors:	Rusakov, I. Yu, Buinovskii, A. S., Sofronov, V. L.
Format:	Journal Article
Language:	English
Published:	Moscow Pleiades Publishing 01-11-2016 Springer Nature B.V
Subjects:	Aluminum Chemistry and Materials Science Chips Impurities Iron Materials Science Metallic Materials Nickel Pilots Sublimation Zirconium metallic zirconium chips zirconium tetrafluoride removal of impurities desublimation intensification sublimation
Online Access:	Get full text
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Summary:	The sublimation refining of zirconium tetrafluoride (ZTF) from impurities in the presence of metallic zirconium chips is studied. It is shown that, in the presence of metallic zirconium chips, the contents of aluminum, nickel, oxygen, chromium, iron, and silicon impurities in a desublimate decrease and the rate of ZTF sublimation increases. The method of refining is tested under laboratory and pilot conditions and can be recommended for commercial application.
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0036-0295 1555-6255 1531-8648
DOI:	10.1134/S0036029516110124