XAFS studies of ytterbium doped lead-telluride

XAFS studies of ytterbium doped lead-telluride

X-ray Absorption Fine Structure (XAFS) measurements were performed on uniformly doped PbTe:Yb (1.3 at.%) at all elemental absorption edges and the analysis of the results has provided precise information on the local structure around each atom. From the near edge part of the absorption spectra it wa...

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Bibliographic Details
Published in:Journal of alloys and compounds Vol. 501; no. 1; pp. 159 - 163
Main Authors: Radisavljević, I., Novaković, N., Romčević, N., Manasijević, M., Mahnke, H.-E., Ivanović, N.
Format: Journal Article
Language:English
Published: Elsevier B.V 02-07-2010
Subjects:
Absorption spectra
Alloys
Atomic absorption analysis
Fine structure
Lattices
Lead base alloys
Lead-telluride
X-rays
XAFS
Yb mean valence
Ytterbium
Lead-telluride
Yb mean valence
XAFS
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Summary:X-ray Absorption Fine Structure (XAFS) measurements were performed on uniformly doped PbTe:Yb (1.3 at.%) at all elemental absorption edges and the analysis of the results has provided precise information on the local structure around each atom. From the near edge part of the absorption spectra it was determined that Yb is in the mixed valent state, which is predominantly divalent with a small trivalent contribution. The analysis of the high energy region of the absorption spectra revealed that Yb incorporation causes deformation of the host PbTe lattice, manifested through extension of all the nearest-, and next-nearest neighbour distances.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2010.04.068