Thermal expansion of a lead sulfide nanofilm

• Published in: Thin solid films Vol. 548; pp. 230 - 234
• Main Authors: Sadovnikov, S.I., Kozhevnikova, N.S., Rempel, A.А., Magerl, A.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 02-12-2013
• Subjects: Lead sulfide; Thermal expansion; Thin films; X-ray diffraction; Thin films; X-ray diffraction; Thermal expansion; Lead sulfide
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2013.09.079

The thermal expansion of a lead sulfide nanofilm produced by chemical bath deposition was determined by X-ray diffraction (XRD). The thickness of the synthesized film was about 100nm, and the average size of the coherent scattering regions as determined from XRD was about 40nm. The lattice constant of the PbS nanofilm was measured as a function of the annealing temperature from 293 to 473K and as a function of the annealing time at a constant temperature of 423K. The thermal expansion coefficient derived was found almost twice as large as that for coarse-grained PbS.
•The lead sulfide PbS nanofilm is produced by chemical bath deposition.•The thermal expansion of a PbS nanofilm is studied.•Temperature dependence of the lattice constant of the PbS nanofilm is measured.•The thermal expansion coefficient is twice as large as that for coarse-grained PbS.