Hydrogen plasma-enhanced atomic layer deposition of hydrogenated amorphous carbon thin films
Hydrogenated amorphous carbon (a-C:H) thin films were prepared by hydrogen plasma-enhanced atomic layer deposition (PE-ALD). The a-C:H thin films were grown at low temperatures in the range of 150–350 °C using CBr4 as the precursor and hydrogen plasma as the reactant. Raman spectroscopy, secondary i...
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Published in: | Surface & coatings technology Vol. 344; pp. 12 - 20 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Lausanne
Elsevier B.V
25-06-2018
Elsevier BV |
Subjects: | |
Online Access: | Get full text |
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Summary: | Hydrogenated amorphous carbon (a-C:H) thin films were prepared by hydrogen plasma-enhanced atomic layer deposition (PE-ALD). The a-C:H thin films were grown at low temperatures in the range of 150–350 °C using CBr4 as the precursor and hydrogen plasma as the reactant. Raman spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy and Fourier transform infrared measurements showed that the a-C:H films consist of hydrogenated nanocrystalline sp3 diamond, disordered sp3 carbon and sp2-hybridized graphitic carbon incorporated with oxygen as a main contaminant. Moreover, the incorporation of bromine and oxygen in the a-C:H films was significantly reduced upon increasing the growth temperature from 200 to 300 °C. Surface hydroxylation and precursor exposure pretreatments were employed to saturate the adsorption of CBr4 precursors and enhance the initial nucleation of carbon during the deposition of the a-C:H thin film by the PE-ALD process. In addition, the conformal growth of a-C:H thin films on three-dimensional structures was confirmed.
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•Hydrogen plasma-enhanced atomic layer deposition of hydrogenated amorphous carbon (a-C:H) thin films was developed.•Substrate pretreatments by plasma hydroxylation and CBr4 exposure are helpful for the uniform deposition of a-C:H films.•a-C:H thin films can be deposited on three-dimensional structures in a conformal manner. |
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ISSN: | 0257-8972 1879-3347 |
DOI: | 10.1016/j.surfcoat.2018.02.082 |