An investigation on the phase purity of iron pyrite (FeS2) thin films obtained from the sulfurization of hematite (Fe2O3) thin films

An investigation on the phase purity of iron pyrite (FeS2) thin films obtained from the sulfurization of hematite (Fe2O3) thin films

Iron pyrite (FeS2) thin films were obtained by sulfurization of hematite (Fe2O3) thin films at different sulfurization temperatures (TS) and sulfurization time (tS). Phase purity of sulfurized films was investigated with X-ray diffraction, Raman Spectroscopy and Vibrating sample magnetometry (VSM)....

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Bibliographic Details
Published in:Materials science in semiconductor processing Vol. 106; p. 104775
Main Authors: Srivastava, Ravi P., Ingole, Sarang
Format: Journal Article
Language:English
Published: Elsevier Ltd 01-02-2020
Subjects:
Pyrite
Raman
Secondary phases
Sulfurization
VSM
XRD
Secondary phases
VSM
Sulfurization
Raman
Pyrite
XRD
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Summary:Iron pyrite (FeS2) thin films were obtained by sulfurization of hematite (Fe2O3) thin films at different sulfurization temperatures (TS) and sulfurization time (tS). Phase purity of sulfurized films was investigated with X-ray diffraction, Raman Spectroscopy and Vibrating sample magnetometry (VSM). Sulfurization temperature and time were found to have a complementary effect on the phase purity of pyrite films. Secondary phase formation in the pyrite films decreased with increasing sulfurization temperature or time. Pyrite films confirmed to be phase pure with XRD and Raman spectroscopy showed the presence of other phase(s) when analyzed with VSM. Merely XRD measurements were not sufficient to claim the phase purity of pyrite films.
ISSN:1369-8001
1873-4081
DOI:10.1016/j.mssp.2019.104775