Direct total-reflection X-ray fluorescence trace element analysis of organic matrix materials with a semiempirical standard

• Published in: Spectrochimica acta. Part B : Atomic spectroscopy Vol. 52; no. 7; pp. 923 - 933
• Main Authors: Greaves, E.D., Bernasconi, G., Wobrauschek, P., Streli, C.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Lausanne Elsevier B.V 01-07-1997; Amsterdam Elsevier Science; New York, NY
• Subjects: Analytical chemistry; Chemistry; Exact sciences and technology; Organic sample; Semiempirical standard model; Spectrometric and optical methods; Trace element analysis; TXRF; Organic sample; Semiempirical standard model; Trace element analysis; TXRF; Trace analysis; Chemical analysis; Multicomponent analysis; Inorganic material; Theoretical study; Organic material; X ray fluorescence spectrometry; Standard; Total reflection; Experimental study; Quantitative analysis
• ISSN: 0584-8547; 1873-3565
• DOI: 10.1016/S0584-8547(96)01655-2

In this work we describe a method for trace element analysis in organic matrix materials using direct irradiation of the sample in a total-reflection X-ray fluorescence spectrometer. The method avoids: (i) the need to digest the organic material, (ii) the need to add an internal standard to the unknown specimens, and (iii) the need to weigh the test specimen. Quantification of unknowns is achieved with the scattered peak as the internal standard and a semiempirical computational model of a standard, instead of a real reference material, for spectrometer sensitivity calibration. Spectra of certified standard reference materials with an organic matrix, obtained with a monochromatized beam from an X-ray tube, were quantified, showing good agreement with nominal, certified or previously reported values for solid and liquid samples. © 1997 Elsevier Science B.V.