The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection

The detection properties of scintillators used in charge-coupled device cameras suitable for electron microscopy are examined with particular emphasis on the statistics of electron scattering and photon generation in the scintillator. We show that the root of the power spectrum of an evenly illumina...

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Bibliographic Details
Published in:	Ultramicroscopy Vol. 75; no. 1; pp. 23 - 33
Main Authors:	R. Meyer, Rüdiger, Kirkland, Angus
Format:	Journal Article
Language:	English
Published:	Amsterdam Elsevier B.V 01-10-1998 Elsevier Science
Subjects:	Applied sciences Charge-coupled device camera Detection quantum efficiency Electron, positron and ion microscopes, electron diffractometers and related techniques Electronics Exact sciences and technology Fundamental areas of phenomenology (including applications) Imaging and optical processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Modulation and optical transfer functions Modulation transfer function Optics Optoelectronic devices Photodetectors (including infrared and CCD detectors) Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Detection quantum efficiency 036 Charge-coupled device camera 07.78 Modulation transfer function 85.60.G 42.30.L Scintillator CCD camera Quantum efficiency Electron detection Experimental study TEM Scattering theory
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