A scanning laser microscope system to observe static and dynamic magnetic domain behavior

Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this mic...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement Vol. 51; no. 1; pp. 10 - 13
Main Authors: Clegg, W., Jenkins, D.F.L., Helian, N., Windmill, J.F.C., Fry, N., Atkinson, R., Hendren, W.R., Wright, C.D.
Format: Journal Article
Language:English
Published: New York IEEE 01-02-2002
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented.
AbstractList Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented
Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented.
Author Helian, N.
Clegg, W.
Fry, N.
Hendren, W.R.
Wright, C.D.
Windmill, J.F.C.
Jenkins, D.F.L.
Atkinson, R.
Author_xml – sequence: 1
  givenname: W.
  surname: Clegg
  fullname: Clegg, W.
  organization: Centre for Res. in Inf. Storage Technol., Univ. of Plymouth, UK
– sequence: 2
  givenname: D.F.L.
  surname: Jenkins
  fullname: Jenkins, D.F.L.
– sequence: 3
  givenname: N.
  surname: Helian
  fullname: Helian, N.
– sequence: 4
  givenname: J.F.C.
  surname: Windmill
  fullname: Windmill, J.F.C.
– sequence: 5
  givenname: N.
  surname: Fry
  fullname: Fry, N.
– sequence: 6
  givenname: R.
  surname: Atkinson
  fullname: Atkinson, R.
– sequence: 7
  givenname: W.R.
  surname: Hendren
  fullname: Hendren, W.R.
– sequence: 8
  givenname: C.D.
  surname: Wright
  fullname: Wright, C.D.
BookMark eNp90TtPwzAQAGALFYlSGFiZLAYQQ8rZjl9jVfGSKrHAwBQ5jlNSJXaJ00r99yRKxcDAdNLdpzvd3Tma-OAdQlcE5oSAfiB6rpVWSpygKeFcJloIOkFTAKISnXJxhs5j3ACAFKmcos8FjtZ4X_k1rk10LW4q24Zow9bheIida3AXcMj70r7PdKarLDa-wMXBm97ixqy9G5JFaEzlce6-zL4K7QU6LU0d3eUxztDH0-P78iVZvT2_LherxDImuoSlJSFaCilszrgsmC1snlNaAJQpzXNNS0vBMQBOlEw500XJlVVC6VwqDmyG7sa-2zZ871zssqaK1tW18S7sYqZBaq4VyF7e_iupEpASrnp48wduwq71_RaZUimnjMph7v2IhnPF1pXZtq0a0x4yAtnwi4zobPxFb69HWznnft2x-APUT4TS
CODEN IEIMAO
CitedBy_id crossref_primary_10_1103_PhysRevLett_120_067601
crossref_primary_10_1109_TIM_2004_831488
Cites_doi 10.1063/1.118524
10.1016/0304-8853(91)90213-T
10.1109/20.490346
10.1088/0957-0233/4/4/009
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002
DBID RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
F28
FR3
H8D
DOI 10.1109/19.989886
DatabaseName IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE Electronic Library Online
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
Aerospace Database
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
Aerospace Database
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Solid State and Superconductivity Abstracts

Aerospace Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1557-9662
EndPage 13
ExternalDocumentID 2431382651
10_1109_19_989886
989886
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
85S
8WZ
97E
A6W
AAJGR
AASAJ
AAYOK
ABQJQ
ABVLG
ACGFO
ACIWK
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RIG
RNS
TN5
TWZ
VH1
VJK
XFK
AAYXX
CITATION
7SP
7U5
8FD
L7M
F28
FR3
H8D
ID FETCH-LOGICAL-c336t-34f1197676cb357d3cdcbb22d00f42bb92fc20e30051874539df58c8689b78503
IEDL.DBID RIE
ISSN 0018-9456
IngestDate Sat Aug 17 04:03:34 EDT 2024
Fri Aug 16 01:27:21 EDT 2024
Thu Oct 10 19:56:53 EDT 2024
Fri Aug 23 03:39:06 EDT 2024
Wed Jun 26 19:31:42 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c336t-34f1197676cb357d3cdcbb22d00f42bb92fc20e30051874539df58c8689b78503
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
PQID 884523270
PQPubID 23500
PageCount 4
ParticipantIDs proquest_miscellaneous_907959807
proquest_miscellaneous_28604158
crossref_primary_10_1109_19_989886
ieee_primary_989886
proquest_journals_884523270
PublicationCentury 2000
PublicationDate 2002-02-01
PublicationDateYYYYMMDD 2002-02-01
PublicationDate_xml – month: 02
  year: 2002
  text: 2002-02-01
  day: 01
PublicationDecade 2000
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on instrumentation and measurement
PublicationTitleAbbrev TIM
PublicationYear 2002
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref2
ref1
ref4
ref3
References_xml – ident: ref4
  doi: 10.1063/1.118524
– ident: ref1
  doi: 10.1016/0304-8853(91)90213-T
– ident: ref2
  doi: 10.1109/20.490346
– ident: ref3
  doi: 10.1088/0957-0233/4/4/009
SSID ssj0007647
Score 1.6768771
Snippet Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Publisher
StartPage 10
SubjectTerms Dynamical systems
Dynamics
Imaging
Kerr effect
Lasers
Magnetic domains
Magnetic force microscopy
Magnetic materials
Magnetic properties
Magnetic switching
Magnetization
Magnetooptic effects
Microscopes
Optical design
Optical materials
Scanning
Title A scanning laser microscope system to observe static and dynamic magnetic domain behavior
URI https://ieeexplore.ieee.org/document/989886
https://www.proquest.com/docview/884523270
https://search.proquest.com/docview/28604158
https://search.proquest.com/docview/907959807
Volume 51
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3JTsMwEB3RSkhwYCkgymohrm1dx7XHR8QiTlwACU5RvARxaIKa9v_x0lQg4MAtchwlGsezeGbeA7jk0jBjvfYT3p74AMWxgQqwlWg5kzokjiK6_v2jfHjBm1ve4mzHXhjnXCw-c8NwGXP5tjaLcFQ2ClyHKDrQkQpTq9ZK6UrBEzzm2O9f7xQsQYTGVI3Gapge_GZ6IpfKDwUcrcrd9r--Zwe2ls4juUqrvQtrrurB5hdIwR6sx5JO0-zB6xVpTGIkIt5FdjMyDcV3sQ2FJABnMq9JrcO5rB8JOXlDisoSm1jqybR4q0KPI7H1tHivSNvSvw_Pd7dP1_eDJZHCwGSZmA8yXoZsoZDC6GwibWas0ZoxS2nJmdaKlYZRF5DrA0XfJFO2nKBBgUr7xaLZAXSrunKHQLDwagm9GpBGe1_GITWWS8YLiaJErvtw0co4_0h4GXmMM6jKxypPEutDLwhzNaEdPW4XI19upCZH5D5UZpL24Xx11--AkNYoKlcvmpyhCDgD2AfyxwxFA6M6Unn064uPYSNyvMRa7BPozmcLdwqdxi7O4k_2CYUgz14
link.rule.ids 315,782,786,798,27933,27934,54767
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3JTsMwEB2xCAEHlgKiFKiFuBZcx_VyrKBVEYULIMEpipcgDk0Qaf8fL00FAg7cIsdRonE8i2fmPYBzyjXRxmk_5uyJC1As6UgPWykMJVz5xFFA1x898PtncT2gNc526IWx1obiM3vhL0Mu35R65o_KLj3XoWDLsNqjnPHYrLVQu5zRCJDZdTvYuQVzGKEulpddeREf_WZ8ApvKDxUc7Mpw-19ftANbc_cR9eN678KSLRqw-QVUsAFroahTV3vw0keVjpxEyDnJ9gNNfPldaERBEcIZTUtUKn8y60Z8Vl6jrDDIRJ56NMleC9_liEw5yd4KVDf178PTcPB4NerMqRQ6OknYtJPQ3OcLGWdaJT1uEm20UoQYjHNKlJIk1wRbj13vSfp6iTR5T2jBhFRuuXByACtFWdhDQCJzikk4RcC1ct6MFVgbygnNuGC5oKoJZ7WM0_eImJGGSAPLtCvTKLEmNLwwFxPq0Va9GOl8K1WpENQFy4TjJrQXd90e8ImNrLDlrEqJYB5pQDQB_TFDYs-pLjA_-vXFbVgfPd6N0_HN_W0LNgLjS6jMPoaV6cfMnsByZWan4Yf7BJRo0q8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+scanning+laser+microscope+system+to+observe+static+and+dynamic+magnetic+domain+behavior&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Clegg%2C+W.&rft.au=Jenkins%2C+D.F.L.&rft.au=Helian%2C+N.&rft.au=Windmill%2C+J.F.C.&rft.date=2002-02-01&rft.pub=IEEE&rft.issn=0018-9456&rft.eissn=1557-9662&rft.volume=51&rft.issue=1&rft.spage=10&rft.epage=13&rft_id=info:doi/10.1109%2F19.989886&rft.externalDocID=989886
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon