A scanning laser microscope system to observe static and dynamic magnetic domain behavior
Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this mic...
Saved in:
Published in: | IEEE transactions on instrumentation and measurement Vol. 51; no. 1; pp. 10 - 13 |
---|---|
Main Authors: | , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
IEEE
01-02-2002
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Abstract | Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented. |
---|---|
AbstractList | Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static system capable of imaging magnetic domains. Dynamic capability was introduced with the development of the R-Theta microscope. However, this microscope utilizes a rotating drive. A scanning laser microscope has been designed to observe the dynamic behavior of domain switching during the thermomagnetic write process and the subsequent magnetization state (domain orientation) in stationary media, without the requirement for a rotating drive. It may also be used to write to the magneto-optic (MO) disk material thermomagnetically prior to imaging. Images are derived from the longitudinal and polar magneto-optic Kerr effects. In this paper, the different configurations for imaging are described and some initial images are presented. |
Author | Helian, N. Clegg, W. Fry, N. Hendren, W.R. Wright, C.D. Windmill, J.F.C. Jenkins, D.F.L. Atkinson, R. |
Author_xml | – sequence: 1 givenname: W. surname: Clegg fullname: Clegg, W. organization: Centre for Res. in Inf. Storage Technol., Univ. of Plymouth, UK – sequence: 2 givenname: D.F.L. surname: Jenkins fullname: Jenkins, D.F.L. – sequence: 3 givenname: N. surname: Helian fullname: Helian, N. – sequence: 4 givenname: J.F.C. surname: Windmill fullname: Windmill, J.F.C. – sequence: 5 givenname: N. surname: Fry fullname: Fry, N. – sequence: 6 givenname: R. surname: Atkinson fullname: Atkinson, R. – sequence: 7 givenname: W.R. surname: Hendren fullname: Hendren, W.R. – sequence: 8 givenname: C.D. surname: Wright fullname: Wright, C.D. |
BookMark | eNp90TtPwzAQAGALFYlSGFiZLAYQQ8rZjl9jVfGSKrHAwBQ5jlNSJXaJ00r99yRKxcDAdNLdpzvd3Tma-OAdQlcE5oSAfiB6rpVWSpygKeFcJloIOkFTAKISnXJxhs5j3ACAFKmcos8FjtZ4X_k1rk10LW4q24Zow9bheIida3AXcMj70r7PdKarLDa-wMXBm97ixqy9G5JFaEzlce6-zL4K7QU6LU0d3eUxztDH0-P78iVZvT2_LherxDImuoSlJSFaCilszrgsmC1snlNaAJQpzXNNS0vBMQBOlEw500XJlVVC6VwqDmyG7sa-2zZ871zssqaK1tW18S7sYqZBaq4VyF7e_iupEpASrnp48wduwq71_RaZUimnjMph7v2IhnPF1pXZtq0a0x4yAtnwi4zobPxFb69HWznnft2x-APUT4TS |
CODEN | IEIMAO |
CitedBy_id | crossref_primary_10_1103_PhysRevLett_120_067601 crossref_primary_10_1109_TIM_2004_831488 |
Cites_doi | 10.1063/1.118524 10.1016/0304-8853(91)90213-T 10.1109/20.490346 10.1088/0957-0233/4/4/009 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002 |
DBID | RIA RIE AAYXX CITATION 7SP 7U5 8FD L7M F28 FR3 H8D |
DOI | 10.1109/19.989886 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library Online CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database Aerospace Database |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Aerospace Database Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Solid State and Superconductivity Abstracts Aerospace Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1557-9662 |
EndPage | 13 |
ExternalDocumentID | 2431382651 10_1109_19_989886 989886 |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 85S 8WZ 97E A6W AAJGR AASAJ AAYOK ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS TN5 TWZ VH1 VJK XFK AAYXX CITATION 7SP 7U5 8FD L7M F28 FR3 H8D |
ID | FETCH-LOGICAL-c336t-34f1197676cb357d3cdcbb22d00f42bb92fc20e30051874539df58c8689b78503 |
IEDL.DBID | RIE |
ISSN | 0018-9456 |
IngestDate | Sat Aug 17 04:03:34 EDT 2024 Fri Aug 16 01:27:21 EDT 2024 Thu Oct 10 19:56:53 EDT 2024 Fri Aug 23 03:39:06 EDT 2024 Wed Jun 26 19:31:42 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c336t-34f1197676cb357d3cdcbb22d00f42bb92fc20e30051874539df58c8689b78503 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 884523270 |
PQPubID | 23500 |
PageCount | 4 |
ParticipantIDs | proquest_miscellaneous_907959807 proquest_miscellaneous_28604158 crossref_primary_10_1109_19_989886 ieee_primary_989886 proquest_journals_884523270 |
PublicationCentury | 2000 |
PublicationDate | 2002-02-01 |
PublicationDateYYYYMMDD | 2002-02-01 |
PublicationDate_xml | – month: 02 year: 2002 text: 2002-02-01 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on instrumentation and measurement |
PublicationTitleAbbrev | TIM |
PublicationYear | 2002 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref2 ref1 ref4 ref3 |
References_xml | – ident: ref4 doi: 10.1063/1.118524 – ident: ref1 doi: 10.1016/0304-8853(91)90213-T – ident: ref2 doi: 10.1109/20.490346 – ident: ref3 doi: 10.1088/0957-0233/4/4/009 |
SSID | ssj0007647 |
Score | 1.6768771 |
Snippet | Scanning laser microscopes (SLMs) have been used to characterize the magnetic properties of materials for some time. The first SLM built was a purely static... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 10 |
SubjectTerms | Dynamical systems Dynamics Imaging Kerr effect Lasers Magnetic domains Magnetic force microscopy Magnetic materials Magnetic properties Magnetic switching Magnetization Magnetooptic effects Microscopes Optical design Optical materials Scanning |
Title | A scanning laser microscope system to observe static and dynamic magnetic domain behavior |
URI | https://ieeexplore.ieee.org/document/989886 https://www.proquest.com/docview/884523270 https://search.proquest.com/docview/28604158 https://search.proquest.com/docview/907959807 |
Volume | 51 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3JTsMwEB3RSkhwYCkgymohrm1dx7XHR8QiTlwACU5RvARxaIKa9v_x0lQg4MAtchwlGsezeGbeA7jk0jBjvfYT3p74AMWxgQqwlWg5kzokjiK6_v2jfHjBm1ve4mzHXhjnXCw-c8NwGXP5tjaLcFQ2ClyHKDrQkQpTq9ZK6UrBEzzm2O9f7xQsQYTGVI3Gapge_GZ6IpfKDwUcrcrd9r--Zwe2ls4juUqrvQtrrurB5hdIwR6sx5JO0-zB6xVpTGIkIt5FdjMyDcV3sQ2FJABnMq9JrcO5rB8JOXlDisoSm1jqybR4q0KPI7H1tHivSNvSvw_Pd7dP1_eDJZHCwGSZmA8yXoZsoZDC6GwibWas0ZoxS2nJmdaKlYZRF5DrA0XfJFO2nKBBgUr7xaLZAXSrunKHQLDwagm9GpBGe1_GITWWS8YLiaJErvtw0co4_0h4GXmMM6jKxypPEutDLwhzNaEdPW4XI19upCZH5D5UZpL24Xx11--AkNYoKlcvmpyhCDgD2AfyxwxFA6M6Unn064uPYSNyvMRa7BPozmcLdwqdxi7O4k_2CYUgz14 |
link.rule.ids | 315,782,786,798,27933,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3JTsMwEB2xCAEHlgKiFKiFuBZcx_VyrKBVEYULIMEpipcgDk0Qaf8fL00FAg7cIsdRonE8i2fmPYBzyjXRxmk_5uyJC1As6UgPWykMJVz5xFFA1x898PtncT2gNc526IWx1obiM3vhL0Mu35R65o_KLj3XoWDLsNqjnPHYrLVQu5zRCJDZdTvYuQVzGKEulpddeREf_WZ8ApvKDxUc7Mpw-19ftANbc_cR9eN678KSLRqw-QVUsAFroahTV3vw0keVjpxEyDnJ9gNNfPldaERBEcIZTUtUKn8y60Z8Vl6jrDDIRJ56NMleC9_liEw5yd4KVDf178PTcPB4NerMqRQ6OknYtJPQ3OcLGWdaJT1uEm20UoQYjHNKlJIk1wRbj13vSfp6iTR5T2jBhFRuuXByACtFWdhDQCJzikk4RcC1ct6MFVgbygnNuGC5oKoJZ7WM0_eImJGGSAPLtCvTKLEmNLwwFxPq0Va9GOl8K1WpENQFy4TjJrQXd90e8ImNrLDlrEqJYB5pQDQB_TFDYs-pLjA_-vXFbVgfPd6N0_HN_W0LNgLjS6jMPoaV6cfMnsByZWan4Yf7BJRo0q8 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+scanning+laser+microscope+system+to+observe+static+and+dynamic+magnetic+domain+behavior&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Clegg%2C+W.&rft.au=Jenkins%2C+D.F.L.&rft.au=Helian%2C+N.&rft.au=Windmill%2C+J.F.C.&rft.date=2002-02-01&rft.pub=IEEE&rft.issn=0018-9456&rft.eissn=1557-9662&rft.volume=51&rft.issue=1&rft.spage=10&rft.epage=13&rft_id=info:doi/10.1109%2F19.989886&rft.externalDocID=989886 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon |